The new design of the THz streak camera at PSI

I. Gorgisyan; P. N. Juranic; R. Ischebeck; A. Stepanov; V. Schlott; C. Pradervand; L. Patthey; M. Radovic; R. Abela; C. P. Hauri; B. Monoszlai; R. Ivanov; P. Peier; J. Liu; T. Togashi; S. Owada; K. Ogawa; T. Katayama; M. Yabashi; L. Rivkin

doi:10.1117/12.2182204

12 May 2015 The new design of the THz streak camera at PSI

I. Gorgisyan, P. N. Juranic, R. Ischebeck, A. Stepanov, V. Schlott, C. Pradervand, L. Patthey, M. Radovic, R. Abela, C. P. Hauri, B. Monoszlai, R. Ivanov, P. Peier, J. Liu, T. Togashi, S. Owada, K. Ogawa, T. Katayama, M. Yabashi, L. Rivkin

Author Affiliations +

Proceedings Volume 9512, Advances in X-ray Free-Electron Lasers Instrumentation III; 95120D (2015) https://doi.org/10.1117/12.2182204
Event: SPIE Optics + Optoelectronics, 2015, Prague, Czech Republic

Abstract

SwissFEL is the Free Electron Laser (FEL) facility under construction at the Paul Scherrer institute (PSI), aiming to provide users with X-ray pulses of lengths down to 2 femtoseconds at standard operation. The measurement of the length of the FEL pulses and their arrival time relative to the experimental laser is crucial for the pump-probe experiments carried out in such facilities. This work presents a new device that measures hard X-ray FEL pulses based on the THz streak camera concept. It describes the prototype setup called pulse arrival and length monitor (PALM) developed at PSI and tested in Spring-8 Angstrom Compact Free Electron Laser (SACLA) in Japan. Based on the first results obtained from the measurements, we introduce the new improved design of the second generation PALM setup that is currently under construction and will be used in SwissFEL photon diagnostics.

Citation Download Citation

I. Gorgisyan, P. N. Juranic, R. Ischebeck, A. Stepanov, V. Schlott, C. Pradervand, L. Patthey, M. Radovic, R. Abela, C. P. Hauri, B. Monoszlai, R. Ivanov, P. Peier, J. Liu, T. Togashi, S. Owada, K. Ogawa, T. Katayama, M. Yabashi, and L. Rivkin "The new design of the THz streak camera at PSI", Proc. SPIE 9512, Advances in X-ray Free-Electron Lasers Instrumentation III, 95120D (12 May 2015); https://doi.org/10.1117/12.2182204

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