1 May 2015 First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system
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Abstract
The quadrupole lens free multiple profile emittance measurement method is an adaptation of the standard multiple profile monitor method for electron beam emittance measurement which was tested at PW laser system. This single shot technique allows to obtain the emittance from beam profile radii fit by means of Twiss (Courant-Snyder) parameters. Lanex scintillating screens were used as profile monitors due to their high yield of visible photons. However, on the other hand, the screen is a source of multiple Coulomb scattering which can influence the beam profile on the following screens at relatively low electron energies. Nevertheless, the contribution of the multiple scattering can be effectively subtracted from the signal by e.g. Bayes unfolding. For high energy beams (E > 0.5 GeV), the multiple scattering contribution is negligible. The presented diagnostics is easy to be implemented into standard experimental setups without any special requests for alignment procedure. Moreover, it can be useful in the optimization phase of the laser plasma accelerator where beam fundamental parameters (energy, energy spread, divergence, pointing) typically fluctuate shot-to- shot.
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M. Krůs, T. Levato, H. T. Kim, G. Grittani, D. Margarone, T. M. Jeong, T. Mocek, G. Korn, "First experimental test of quadrupole lens-free multiple profile monitor technique for electron beam emittance measurement with a PW laser system", Proc. SPIE 9515, Research Using Extreme Light: Entering New Frontiers with Petawatt-Class Lasers II, 95151K (1 May 2015); doi: 10.1117/12.2179483; https://doi.org/10.1117/12.2179483
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