1 June 2015 Modeling of HgCdTe focal plane array spectral inhomogeneities
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Infrared focal plane arrays (IRFPA) are widely used to perform high quality measurements such as spectrum acquisition at high rate, ballistic missile defense, gas detection, and hyperspectral imaging. For these applications, the fixed pattern noise represents one of the major limiting factors of the array performance. This sensor imperfection refers to the nonuniformity between pixels, and is partially caused by disparities of the cut-off wavenumbers. In this work, we focus particularly on mercury cadmium telluride (HgCdTe), which is the most important material of IR cooled detector applications. Among the many advantages of this ternary alloy is the tunability of the bandgap energy with Cadmium composition, as well as the high quantum efficiency. In order to predict and understand spectral inhomogeneities of HgCdTe-based IRFPA, we propose a modeling approach based on the description of optical phenomena inside the pixels. The model considers the p-n junctions as a unique absorbent bulk layer, and derives the sensitivity of the global structure to both Cadmium composition and HgCdTe layer thickness. For this purpose, HgCdTe optical and material properties were necessary to be known at low temperature (80K), in our operating conditions. We therefore achieved the calculation of the real part of the refractive index using subtracti
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Salima Mouzali, Salima Mouzali, Sidonie Lefebvre, Sidonie Lefebvre, Sylvain Rommeluère, Sylvain Rommeluère, Yann Ferrec, Yann Ferrec, Jérôme Primot, Jérôme Primot, "Modeling of HgCdTe focal plane array spectral inhomogeneities", Proc. SPIE 9520, Integrated Photonics: Materials, Devices, and Applications III, 95200S (1 June 2015); doi: 10.1117/12.2178471; https://doi.org/10.1117/12.2178471


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