4 March 2015 Simulation and detection of electron back-scattering in ion barrier films of micro-channel plate
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Proceedings Volume 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I; 952109 (2015) https://doi.org/10.1117/12.2087256
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China
Abstract
The simulation calculation and analysis on the electron backscattering for ion barrier films (IBFs) of Al2O3 were performed by Monte Carlo methods. Simulation and experimental detection both found that electron backscattering ratio is inversely proportional to the incident electron energy, proportional to the film thickness and density. But if the film is thick enough, the back scattering ratio will not continue to increase, will maintain a relatively stable value. This work provided a theory support for fabricating high performance low-level-light device.
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Shencheng Fu, Ye Li, Feng Shi, Zhuang Miao, Hongchang Cheng, Qingduo Duanmu, "Simulation and detection of electron back-scattering in ion barrier films of micro-channel plate", Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 952109 (4 March 2015); doi: 10.1117/12.2087256; https://doi.org/10.1117/12.2087256
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