4 March 2015 Research and test on noise factor of two-cascaded MCPs
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Proceedings Volume 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I; 95210U (2015) https://doi.org/10.1117/12.2175498
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China
Abstract
Comparing with the single micro-channel plate (MCP), the structure of cascaded micro-channel plates possesses the advantages of higher gain and lower dark current, etc. In order to improve its performance further, a structure of two-cascaded MCPs with accelerating electric field was raised. As noise characteristic is an important indicator to evaluate the performance of optoelectronic devices, therefore, it is of great significance to test the noise factor of two-cascaded MCPs. The structures of two-cascaded MCPs with and without accelerating electric field are taked as research object. Through changing their working conditions, the SNR of each situation were measured respectively. And the noise factor of each situation were deduced. The experimental results show that structure of two-cascade MCPs with the accelerating electric field possesses higher SNR and lower noise factor.
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Yiqing Zang, Jingjing Xie, Yang Li, Ye Li, "Research and test on noise factor of two-cascaded MCPs", Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 95210U (4 March 2015); doi: 10.1117/12.2175498; https://doi.org/10.1117/12.2175498
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