13 April 2015 Investigation on choosing technical parameters for pulse thermography
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Proceedings Volume 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II; 95220J (2015) https://doi.org/10.1117/12.2178781
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China
Abstract
Composite material connected by glue has gained popularity as a replacement for conventional materials and structures to reduce weight and improve strength in the aerospace industry, with the development of material science and structural mechanics. However, the adhesive bonding process is more susceptible to quality variations during manufacturing than traditional joining methods. The integrality, strength and rigidity of product would be broken by disbonding. Infrared thermography is one of several non-destructive testing techniques which can be used for defect detection in aircraft materials. Pulsed infrared thermography has been widely used in aerospace and mechanical manufacture industry because it can offer noncontact, quickly and visual examinations of disbonding defects. However the parameter choosing method is difficult to decide. Investigate the choosing technical parameters for pulse thermograpghy is more important to ensure the product quality and testing efficiency. In this paper, two kinds of defects which are of various size, shape and location below the test surface are planted in the honeycomb structure, they are all tested by pulsed thermography. This paper presents a study of single factor experimental research on damage sample in simulation was carried out. The impact of the power of light source, detection distance, and the wave band of thermography camera on detecting effect is studied. The select principle of technique is made, the principle supplied basis for selection of detecting parameters in real part testing.
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Huijuan Li, "Investigation on choosing technical parameters for pulse thermography", Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95220J (13 April 2015); doi: 10.1117/12.2178781; https://doi.org/10.1117/12.2178781
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