13 April 2015 Discussion of beam quality of semiconductor lasers
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Proceedings Volume 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II; 95221W (2015) https://doi.org/10.1117/12.2180240
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held August-October 2014, 2014, China, China
Abstract
Based on the beam characteristics of semiconductor lasers, a new parameter for evaluating beam quality of semiconductor lasers is introduced. The shortcomings of M2 factor used in evaluating beam quality of semiconductor lasers are discussed and its limitations are pointed out. Moreover, some important aspects of the beam quality factor are discussed. The main factors to influence collimating the beam of semiconductor lasers are analyzed. Our results give us grounds to make the following conclusions: the new propagation parameter succeeds in its universality and adaptability.
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Chang-Qing Cao, Chang-Qing Cao, Xiao-Dong Zeng, Xiao-Dong Zeng, Xiang Wang, Xiang Wang, Zhi Lai, Zhi Lai, Long Luo, Long Luo, } "Discussion of beam quality of semiconductor lasers", Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95221W (13 April 2015); doi: 10.1117/12.2180240; https://doi.org/10.1117/12.2180240
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