17 July 2015 A carrier removal approach for fringe projection profilometry using principal component analysis
Author Affiliations +
Proceedings Volume 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015); 952409 (2015); doi: 10.1117/12.2185663
Event: International Conference on Optical and Photonic Engineering (icOPEN2015), 2015, Singapore, Singapore
Abstract
We present a carrier removal method for Fourier transform profilometry using the principal component analysis. The proposed approach is able to decompose the phase map into several principal components, in which the phase of the carrier can be extracted from the first dominant component acquired. It can cope well with the nonlinear carrier problem resulted from the divergent illumination which is commonly adopted in the fringe projection profilometry. It is effective, fully automatic and does not require the estimation for system geometrical parameters or the prior knowledge on the measured object. Further, the influence of the lens distortion is considered thus the carrier can be determined more accurately. The principle of the technique is verified by our experiments.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shijie Feng, Qian Chen, Chao Zuo, Jiasong Sun, "A carrier removal approach for fringe projection profilometry using principal component analysis", Proc. SPIE 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015), 952409 (17 July 2015); doi: 10.1117/12.2185663; http://dx.doi.org/10.1117/12.2185663
PROCEEDINGS
6 PAGES


SHARE
KEYWORDS
Principal component analysis

Fringe analysis

Fourier transforms

Projection systems

Distortion

Phase measurement

Optical filters

Back to Top