Robust speckle metrology for stress measurements outside the lab

Matias R. Viotti; Armando Albertazzi G. Jr.

doi:10.1117/12.2184739

22 June 2015 Robust speckle metrology for stress measurements outside the lab

Matias R. Viotti, Armando Albertazzi G. Jr.

Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 95250T (2015) https://doi.org/10.1117/12.2184739
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

Optical techniques are usually related to laboratory rooms, which are places equipped with temperature, humidity and vibration control. These techniques are very suitable for fast measurements due to their non-contact nature and full-field capability. Among them, optical methods based on the speckle phenomenon have had a great development during the last two decades because of the development of digital image processing, cameras, computers, lasers and optical components. Speckle techniques have the advantages cited for optical methods. Additionally, they are adequate for the evaluation of real components without further preparation of the surface and without high time consuming to be analyzed. This paper supplies tools, tips and reference parameters to develop interferometers based on the speckle phenomenon to be used outside the laboratory room. Finally, applications outside the lab for the measurement of mechanical and residual stresses are presented. These examples show the high potential of speckle metrology as an auxiliary tool for structure integrity assessment.

Citation Download Citation

Matias R. Viotti and Armando Albertazzi G. Jr. "Robust speckle metrology for stress measurements outside the lab", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95250T (22 June 2015); https://doi.org/10.1117/12.2184739

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