22 June 2015 Long wave infrared 3D scanner
Author Affiliations +
Proceedings Volume 9525, Optical Measurement Systems for Industrial Inspection IX; 952514 (2015); doi: 10.1117/12.2184691
Event: SPIE Optical Metrology, 2015, Munich, Germany
In industrial metrology, the system of fringe projection for the fast determination of 3D surface data is established. The combination of areal and structured projection with two-dimensional optical sensors and triangulation measurement principle allows very high measurement point densities with reasonable accuracy. There are great difficulties with high gloss surfaces and with very dark surfaces for state of the art systems. Transparent materials cannot be measured using the visible spectrum of light. We have therefore developed a new structured light projection system that solves these problems. For the first time the physical principle of energy conversion is utilized in areal structured light projection. We are presenting first results to show the advantages and the capability of this new measurement principle.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ernst Wiedenmann, Mohsen Afrough, Sven Albert, Robert Schott, Jan Tusch, Andreas Wolf, "Long wave infrared 3D scanner", Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952514 (22 June 2015); doi: 10.1117/12.2184691; https://doi.org/10.1117/12.2184691

Back to Top