21 June 2015 Wide-aperture laser beam measurement using transmission diffuser: errors modeling
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Instrumental errors of measurement wide-aperture laser beam diameter were modeled to build measurement setup and justify its metrological characteristics. Modeled setup is based on CCD camera and transmission diffuser. This method is appropriate for precision measurement of large laser beam width from 10 mm up to 1000 mm. It is impossible to measure such beams with other methods based on slit, pinhole, knife edge or direct CCD camera measurement. The method is suitable for continuous and pulsed laser irradiation. However, transmission diffuser method has poor metrological justification required in field of wide aperture beam forming system verification. Considering the fact of non-availability of a standard of wide-aperture flat top beam modelling is preferred way to provide basic reference points for development measurement system.

Modelling was conducted in MathCAD. Super-Lorentz distribution with shape parameter 6-12 was used as a model of the beam. Using theoretical evaluations there was found that the key parameters influencing on error are: relative beam size, spatial non-uniformity of the diffuser, lens distortion, physical vignetting, CCD spatial resolution and, effective camera ADC resolution. Errors were modeled for 90% of power beam diameter criteria. 12-order Super-Lorentz distribution was primary model, because it precisely meets experimental distribution at the output of test beam forming system, although other orders were also used.

The analytic expressions were obtained analyzing the modelling results for each influencing data. Attainability of <1% error based on choice of parameters of expression was shown. The choice was based on parameters of commercially available components of the setup. The method can provide up to 0.1% error in case of using calibration procedures and multiple measurements.
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Ivan S. Matsak, Ivan S. Matsak, } "Wide-aperture laser beam measurement using transmission diffuser: errors modeling", Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260K (21 June 2015); doi: 10.1117/12.2184832; https://doi.org/10.1117/12.2184832


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