22 June 2015 Front Matter: Volume 9530
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9530, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Automated Visual Inspection and Machine Vision, edited by Jürgen Beyerer, Fernando Puente León, Proceedings of SPIE Vol. 9530 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628416909

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Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Author Index

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Adamo, F., 0R

Alekhin, Artem A., 0J

Anastasiadis, Johannes, 0A

Anisimov, Andrei G., 0E

Asgari, Reza, 0Q

Bakhshi, Hadi, 0Q

Bateman, Richard, 0C

Bauer, Sebastian, 09

Brandejs, Jan, 05

Bubnova, Tatiana P., 0J

Bui, Duc Anh, 04

Chen, Ding, 06

Chertov, Aleksandr N., 0J

Dantanarayana, Harshana G., 0F

Darudi, Ahmad, 0Q

Deleener, R., 0D

Distante, C., 0R

Dong, Lizhi, 0L

Feng, Jia-bo, 06

Geerardyn, D., 0D

Gorbatsevich, Vladimir S., 0I

Gorbunova, Elena V., 0E, 0J

Gronle, Marc, 04

Guan, Banglei, 02

Haist, Tobias, 04

Hao, Xiangyang, 0G

He, Xing, 0L

Hernández Mesa, Pilar, 0A

Horvath, Imre, 0H

Huntley, Jonathan M., 0F

Ingelberts, H., 0D

Jiang, Bofan, 04

Jiang, Lixing, 0G

Knyaz, Vladimir A., 0P

Korotaev, Valery V., 07, 0B, 0J, 0K, 0O

Koutecký, Tomáš, 05

Kuijk, M., 0D

Lazarenko, Vasiliy P., 0K

Lebedko, Eugene G., 0M

Lei, Zhihui, 02

Li, Haifeng, 08

Liu, Wenjin, 0L

Liu, Xiaolin, 02

Liu, Xu, 08

Ma, Hong-qiang, 06

Malin, Ivan K., 0P

Mann, Guillermo, 0N

Maruev, Ivan A., 0M

Mazzeo, P. L., 0R

Neumann, Florian, 09

Nikulin, Anton V., 0M

Osten, Wolfgang, 04

Paloušek, David, 05

Pantyushin, Anton V., 0E

Pantyushina, Ekaterina N., 0O

Pavlenko, Nikita A., 0B

Pruss, Christof, 04

Puente León, Fernando, 09, 0A, 0N

Razdan, Vikram, 0C

Rodrigues, Joel J. P. C., 0O

Schaal, Frederik, 04

Serikova, Mariya G., 0E, 0O

Shang, Yang, 02

Sidyakin, Sergey V., 0I

Skamnitskaya, Lyubov S., 0J

Skorupski, Krzysztof, 0H

Spagnolo, P., 0R

Sun, Kuoyuan, 0G

Vasilev, Aleksandr S., 07

Vater, Sebastian, 0N

Vetrano, Maria Rosaria, 0H

Vishnyakov, Boris V., 0I, 0P

Vizilter, Yuri V., 0P

Vygolov, Oleg V., 0P

Wang, Heng, 08

Wang, Shuai, 0L

Wang, Wei, 06

Weisbuch, Francois, 03

Xu, Bing, 0L

Xu, Liang, 08

Yang, Ping, 0L

Yarishev, Sergey, 0K

Yu, Qifeng, 02

Zhang, Jin-guo, 06

Zhang, Shang-bin, 06

Zhang, Ye-hua, 06

Zhao, Fulai, 0G

Zheltov, Sergey Y., 0P

Zyuzin, Vadim V., 0O

Conference Committee

Symposium Chairs

  • Wolfgang Osten, Universität Stuttgart (Germany)

  • Gunther Notni, Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF (Germany)

  • Andrew J. Moore, Heriot-Watt University (United Kingdom)

Conference Chairs

  • Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Fernando Puente León, Karlsruher Institut für Technologie (Germany)

Conference Program Committee

  • Christian Frese, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Andreas Heinrich, Hochschule Aalen (Germany)

  • Michael Heizmann, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Bernd Jähne, Ruprecht-Karls-Universität Heidelberg (Germany)

  • Thomas Längle, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Markus Maurer, VITRONIC Dr.-Ing. Stein Bildverarbeitungssysteme GmbH (Germany)

  • Wolfgang Osten, Universität Stuttgart (Germany)

  • Felix Salazar, Universidad Politécnica de Madrid (Spain)

  • Robert Schmitt, Fraunhofer-Institut für Produktionstechnologie (Germany)

  • Hugo Thienpont, Vrije Universiteit Brussel (Belgium)

  • Stefan Werling, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Ernst Wiedenmann, AiMESS Products GmbH (Germany)

  • Volker Willert, Technische Universität Darmstadt (Germany)

Session Chairs

  • Measurement

    Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Multispectral Inspection

    Fernando Puente León, Karlsruher Institut für Technologie (Germany)

  • Optical Sorting

    Jürgen Beyerer, Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)

  • Inspection, Monitoring and Detection

    Fernando Puente León, Karlsruher Institut für Technologie (Germany)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9530", Proc. SPIE 9530, Automated Visual Inspection and Machine Vision, 953001 (22 June 2015); doi: 10.1117/12.2199155; https://doi.org/10.1117/12.2199155
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