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15 July 2015 Accessing deep optical properties of skin using diffuse reflectance spectroscopy
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Abstract
Diffuse reflectance spectroscopy characterizes composition and structure of tissues by determining their scattering and absorption properties. We have developed in our laboratory a low-cost spatially resolved diffuse reflectance spectroscopy instrument. We present in this study some results showing how to adapt this technology on multi-layered tissues. First of all, a method enabling determination of scattering and absorption properties of multi-layered phantoms is described; the adaptation of the initial methodology to focus on deep layers is especially detailed. Then some preliminary results obtained on a panel of volunteer’s redness faces are presented.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anne Koenig, Blandine Roig, Jimmy Le Digabel, Gwendal Josse, and Jean-Marc Dinten "Accessing deep optical properties of skin using diffuse reflectance spectroscopy", Proc. SPIE 9537, Clinical and Biomedical Spectroscopy and Imaging IV, 95370E (15 July 2015); https://doi.org/10.1117/12.2183573
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