16 January 1989 Talbot Bands : Determination Of Material Dispersion
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Proceedings Volume 0954, Optical Testing and Metrology II; (1989) https://doi.org/10.1117/12.947578
Event: SPIE International Symposium on Optical Engineering and Industrial Sensing for Advance Manufacturing Technologies, 1988, Dearborn, MI, United States
Abstract
A new method for the wavelength dependence of the index of refraction has been recently proposed. It is based upon an accurate determination of the positions of dark bands which appear in the source spectrum observed in the focal plane of a spectroscope while a phase plate is partly inserted in its field. After the method has been reminded, experimental results obtained with known glasses and liquid crystals are reported proving the efficiency and the reliability of the method. In addition of those experimental data, a discussion is devoted to the versality of this new method also the accuracy of the results is considered.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Warenghem, C. P. Grover, "Talbot Bands : Determination Of Material Dispersion", Proc. SPIE 0954, Optical Testing and Metrology II, (16 January 1989); doi: 10.1117/12.947578; https://doi.org/10.1117/12.947578
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