Photonic force microscopy of surface electromagnetic waves in a one-dimensional photonic crystal

Daniil A. Shilkin; Evgeny V. Lyubin; Irina V. Soboleva; Andrey A. Fedyanin

doi:10.1117/12.2191547

Translator Disclaimer

25 August 2015 Photonic force microscopy of surface electromagnetic waves in a one-dimensional photonic crystal

Daniil A. Shilkin, Evgeny V. Lyubin, Irina V. Soboleva, Andrey A. Fedyanin

Author Affiliations +

Proceedings Volume 9548, Optical Trapping and Optical Micromanipulation XII; 954810 (2015) https://doi.org/10.1117/12.2191547
Event: SPIE Nanoscience + Engineering, 2015, San Diego, California, United States

Abstract

The potential of photonic force microscopy (PFM) to directly probe the field of the Bloch surface wave (BSW) in a one-dimensional photonic crystal is considered. Optical forces acting on a dielectric microparticle in the evanescent field of the BSW are estimated in the dipole approximation and calculated by finite-difference time-domain (FDTD) analysis. Technical details of the PFM measurements are described.

Citation Download Citation

Daniil A. Shilkin, Evgeny V. Lyubin, Irina V. Soboleva, and Andrey A. Fedyanin "Photonic force microscopy of surface electromagnetic waves in a one-dimensional photonic crystal", Proc. SPIE 9548, Optical Trapping and Optical Micromanipulation XII, 954810 (25 August 2015); https://doi.org/10.1117/12.2191547

ACCESS THE FULL ARTICLE