Challenges and needs for automating nano image processing for material characterization

Yu Ding; Satish T. S. Bukkapatnam

doi:10.1117/12.2186251

20 August 2015 Challenges and needs for automating nano image processing for material characterization

Yu Ding, Satish T. S. Bukkapatnam

Proceedings Volume 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII; 95560Z (2015) https://doi.org/10.1117/12.2186251
Event: SPIE Nanoscience + Engineering, 2015, San Diego, California, United States

Abstract

Image processing techniques are needed to extract critical information pertinent to nano material characterization but the current processing methods are slow, expensive and labor intensive. There is a strong need to develop fast and reliable methods, enabling process control compatible automated processing of nano images. The authors believe specialized techniques are needed to address the challenges, and will discuss the recent development of nano image processing methods as well as the near- and medium-terms needs in the area of nano metrology and imaging. The authors will share their broad perspectives on this research direction.

Conference Presentation

Citation Download Citation

Yu Ding and Satish T. S. Bukkapatnam "Challenges and needs for automating nano image processing for material characterization", Proc. SPIE 9556, Nanoengineering: Fabrication, Properties, Optics, and Devices XII, 95560Z (20 August 2015); https://doi.org/10.1117/12.2186251

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