Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9563, including the Title Page, Copyright information, Table of Contents, Authors, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, edited by Neelkanth G. Dhere, John H. Wohlgemuth, Rebecca Jones-Albertus, Proceedings of SPIE Vol. 9563 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781628417296

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10–1Z, 20–2Z, etc.

Agroui, Kamel, 0M

Alam, Muhammad Ashraful, 0C

Alcantara, Christopher, 0L

Amspacher, Lucas, 03

Arbet, Juraj, 0V

Asadpour, Reza, 0C

Barreau, Nicolas, 0H

Berghold, J., 0A

Bermel, Peter, 0C

Biggie, R., 09

Birchmier, Jeff, 02

Boháček, Pavol, 0V

Bokria, Jayesh G., 02

Bradley, Alexander Z., 03

Bringuier, S., 08

Brooks, A., 09

Bruckman, Laura S., 0L

Chenvidhya, Dhirayut, 0E, 0G

Chenvidhya, Tanokkorn, 0E, 0G

Dang, Thomas, 0L

Deceglie, Michael G., 0F

Deline, Chris, 0F

Dhere, Neelkanth G., 0I

Dhere, Ramesh G., 0I

Fagerholm, Cara L., 0L

Fan, Zhenzhu, 0T

Felder, Thomas C., 03

Foltz, Benjamin, 03

Foster, Christopher, 0H

French, Roger H., 0L

Frijters, Corné, 0H

Fu, Oakland, 03

Gambogi, William J., 03

Garreau-iles, Lucie, 03

Giovanni, Flaminio, 0M

Glick, Stephen H., 0B

Goel, Nikhil, 0L

Gok, Abdulkerim, 0L

Grunow, P., 0A

Gu, Xiaohong, 04, 05

Guha, Subhendu, 0I

Hacke, Peter, 0B

Hamzavy, Babak, 03

Han, Peide, 0Y

Han, Xiaohu, 0T

Hu, Hongjie, 03

Huang, W.-J., 08

Hunston, Donald L., 04

Huran, Jozef, 0U, 0V

Janke, S., 0A

Kempe, Michael D., 02

Kim, Jae Hyun, 04

Kleinová, Angela, 0U, 0V

Koch, S., 0A

Kopchick, James G., 03

Krommenhoek, Peter J., 05

Kurtz, Sarah R., 0B, 0F

Lai, T., 09

Limsakul, Chamnan, 0E, 0G

Lin, Chiao-Chi, 04, 05

Lou, Shishu, 0Y

Lyu, Yadong, 04

MacQueen, Rowan, xi

Masuda, Atsushi, 07

Miller, David C., 02

Muralidharan, K., 08

Nanjundiah, Kumar, 02

guyen, Tinh, 05

Nobles, Dylan L., 02

Packa, Juraj, 0U

Parinya, Panom, 0E

Paul, J., 08

Peacock, R. Scott, 03

Pellegrino, Michelle, 0M

Perný, Milan, 0U

Perrin, Greg, 0B

Peshek, Timothy J., 0L

Pingel, S., 0A

Potter, B. G., Jr., 08, 09

Ren, Feifei, 0T

Sakurai, Keiichiro, 02, 07

Šály, Vladimír, 0U

Sangpongsanont, Yaowanee, 0E, 0G

Sasinková, Vlasta, 0U, 0V

Schmidt, Timothy W., xi

Seapan, Manit, 0E, 0G

Sekáčova, Mária, 0V

Shioda, Tsuyoshi, 02, 0A

Silverman, Timothy J., 0F

Simmons-Potter, K., 08, 09

Songprakorp, Roongrojana, 0E, 0G

Stanley, Deborah L., 04

Steijvers, Henk, 0H

Stika, Katherine M., 03

Su, Yahui, 0T

Takani, Masayoshi, 07

Takano, Akihiro, 07

Tannil, Nittaya, 0E

Terry, Mason L., 0L

Terwilliger, Kent, 0B

Theelen, Mirjam, 0H

Trout, T. John, 03

Tucker, John, 02

Ukar, A., 0A

Vroon, Zeger, 0H

Wan, Kai-Tak, 04

Ward, Allan, 0I

Watson, Stephanie S., 05

Wheeler, Nicholas R., 0L

Wiengmoon, Buntoon, 0E

Wieting, Robert, 0I

Wohlgemuth, John H., 02

Yoshihara, Toshio, 02

Yu, Bao-Ling, 03

Yu, Li-Chieh, 05

Zabiyaka, Davis, 0L

Zeman, Miro, 0H

Zhang, Huayong, 0T

Zhou, Chao, 0C

Zhu, Huishi, 0Y

Zubillaga, Oihana, 02

Conference Committee

  • Symposium Chair

    • Oleg V. Sulima, GE Global Research (United States)

  • Conference Chair

    • Neelkanth G. Dhere, University of Central Florida (United States)

  • Conference Co-chairs

    • John H. Wohlgemuth, National Renewable Energy Laboratory (United States)

    • Rebecca Jones-Albertus, U.S. Department of Energy (United States)

  • Conference Program Committee

    • David S. Albin, National Renewable Energy Laboratory (United States)

    • Glenn Alers, University of California, Santa Cruz (United States)

    • Ward I. Bower, Sandia National Laboratories (United States)

    • Leila R. O. Cruz, Instituto Militar de Engenharia (Brazil)

    • Takuya Doi, National Institute of Advanced Industrial Science and Technology (Japan)

    • Fernando Fabero, Centro de Investigaciones Energéticas, Medioambientales y Tecnolόgicas (Spain)

    • Vivek S. Gade, Jabil Circuit, Inc. (United States)

    • William J. Gambogi Jr., DuPont (United States)

    • Werner Herrmann, TÜV Rheinland Group (Germany)

    • Stephen J. Hogan, Spire Corporation (United States)

    • Aravinda Kar, CREOL, The College of Optics and Photonics, University of Central Florida (United States)

    • Michael Köhl, Fraunhofer-Institut für Solare Energiesysteme (Germany)

    • Ralf Leutz, Concentrator Optics GmbH (Germany)

    • Xavier Mathew, Centro de Investigaciόn en Energia (Mexico)

    • Robert McConnell, Arzon Solar, LLC (United States)

    • Yoichi Murakami, Japan Electrical Safety & Environment Technology Laboratories (Japan)

    • F. J. John Pern, Sunshine Sci-Tech LLC (United States)

    • Laure-Emmanuelle Perret-Aebi, Ecole Polytechnique Fédérale de Lausanne (Switzerland)

    • Shirish Pethe, Applied Materials, Inc. (United States)

    • Ivan Sinicco, Oerlikon Solar Ltd. (Switzerland)

    • Oleg V. Sulima, GE Global Research (United States)

    • Bolko von Roedern, von Roedern & Associates LLC (United States)

  • Session Chairs

    • 1 Encapsulant, Backsheet and Packaging Materials

      Keiichiro Sakurai, National Institute of Advanced Industrial Science and Technology (Japan)

    • 2 PV Module Reliability Accelerated and Outdoor Testing

      Michael D. Kempe, National Renewable Energy Laboratory (United States)

    • 3 Potential Induced Degradation (PID)

      Takuya Doi, National Institute of Advanced Industrial Science and Technology (Japan)

    • 4 PV Module Reliability I

      Juliane Berghold, PI Photovoltaik-Institut Berlin AG (Germany)

    • 5 Thin Film PV Module Reliability

      Rebecca Jones-Albertus, U.S. Department of Energy (United States)

    • 6 PV Module Reliability II

      Thomas C. Felder, DuPont (United States)

Introduction

The eighth Reliability of Photovoltaic Cells, Modules, Components and Systems conference, part of the 2015 SPIE Optics + Photonics symposium, was composed of a full schedule of highly anticipated presentations from a number of highly regarded experts from both the photovoltaic (PV) industry and academia. The conference was well attended with a number of international papers from national laboratories, institutes and universities in the United States, Japan, Germany, Switzerland, Spain, Algeria, Italy, Thailand, and Brazil.

The first session on Sunday on Encapsulant, Backsheet, and Packaging Materials was chaired by Keiichiro Sakurai from the National Institute of Advanced Industrial Science and Technology, (AIST) (Japan). The session included two invited talks on the development of a resistivity standard for polymeric materials and of backsheet tests and measurements to improve correlation of accelerated exposures to fielded modules of authors from United States, Japan and Switzerland. There were two presentations on cracking, delamination, and mechanical degradation of PV backsheets after accelerated laboratory testing and UV exposure. The second session on PV Module Reliability Accelerated and Outdoor Testing was chaired by Michel D. Kempe, National Renewable Energy Laboratory (United States). It had two invited talks on effects of UV and light illumination and sequential tests such as damp heat, temperature cycling, differential mechanical loading, and humidity freeze on flexible and rigid PV modules. Two other papers on experimental and computational investigation of microcrack behavior under combined environments and comparison of accelerated testing and field exposure. The third session on Potential Induced Degradation (PID) was chaired by Takuya Doi, AIST (Japan). It had three papers (two invited) on survey of PID in thin-film modules and material properties measurements, quality control counter measures and modeling framework for PID in PV modules. The fourth session entitled, “PV Module Reliability I,” was chaired by Juliane Berghold, PI Photovoltaik-Institut Berlin AG (Germany). It had invited and regular papers on reduction of PV rooftop system output power due to heat gain, partial shade stress test of thin-film PV modules, and module reliability improvements and growth of PV industry. This was followed by the symposium-wide plenary session.

The first session on the second day on Thin Film PV Module Reliability was chaired by Rebecca Jones-Albertus, U.S. Dept. of Energy. It had one invited presentation on the effect of atmospheric species on the degradation of CIGS solar cells and molybdenum films. There were three regular presentations on the comparison of reliability of thin-film and multicrystalline silicon PV modules, analysis of thin film PV module degradation using data science, and dark measurements technique. The second session on PV Module Reliability II was chaired by Thomas C. Felder, DuPont (United States). The session had one invited presentation and three regular papers on white solar modules for building integrated photovoltaics, PV reliability group and its activities in the United States and Brazil.

This was followed by plenary session which had a presentation on importance of reliability to the SunShot Initiative. Finally, on Monday afternoon there was a poster session.

The conference organizers would like to thank each presenter for their contribution to the technical program and everyone who participated in this year’s conference for their interest and support. We wish everyone the best of luck in their technical and scientific endeavors, and would like to invite everyone back to next year’s conference to present their latest achievements in the Reliability of Photovoltaic Cells, Modules, Components and Systems.

Neelkanth G. Dhere

John H. Wohlgemuth

Rebecca Jones-Albertus

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9563", Proc. SPIE 9563, Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII, 956301 (8 September 2015); doi: 10.1117/12.2218485; https://doi.org/10.1117/12.2218485
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