Evaluation and control of spatial frequency errors in reflective telescopes

Xuejun Zhang; Xuefeng Zeng; Haixiang Hu; Ligong Zheng

doi:10.1117/12.2187170

27 August 2015 Evaluation and control of spatial frequency errors in reflective telescopes

Xuejun Zhang, Xuefeng Zeng, Haixiang Hu, Ligong Zheng

Author Affiliations +

Proceedings Volume 9575, Optical Manufacturing and Testing XI; 95750C (2015) https://doi.org/10.1117/12.2187170
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

In this paper, the influence on the image quality of manufacturing residual errors was studied. By analyzing the statistical distribution characteristics of the residual errors and their effects on PSF and MTF, we divided those errors into low, middle and high frequency domains using the unit “cycles per aperture”. Two types of mid-frequency errors, algorithm intrinsic and tool path induced were analyzed. Control methods in current deterministic polishing process, such as MRF or IBF were presented.

Citation Download Citation

Xuejun Zhang, Xuejun Zhang, Xuefeng Zeng, Xuefeng Zeng, Haixiang Hu, Haixiang Hu, Ligong Zheng, Ligong Zheng, } "Evaluation and control of spatial frequency errors in reflective telescopes", Proc. SPIE 9575, Optical Manufacturing and Testing XI, 95750C (27 August 2015); doi: 10.1117/12.2187170; https://doi.org/10.1117/12.2187170

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