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10 September 2015 Front Matter: Volume 9576
This PDF file contains the front matter associated with SPIE Proceedings Volume 9576 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Applied Advanced Optical Metrology Solutions, edited by Erik Novak, James D. Trolinger, Proceedings of SPIE Vol. 9576 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628417425

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

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Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Anderson, Erik H., 08

Ao, Lei, 0L

Arai, H., 0N

Arai, Y., 06

Artemiev, Nikolay A., 08

Babin, Sergey, 08

Barber, Zeb W., 0H

Bernacki, Bruce E., 04

Boettcher, T., 09

Brasseur, Jason K., 0I

Buckner, Benjamin D., 0C, 0E

Bui, Son, 07

Burnham-Fay, E. D., 0F

Cabrini, Stefano, 08

Calafiore, Guiseppe, 08

Cannon, Bret D., 04

Chan, Elaine R., 08

Compertore, David C., 0M

Crouch, Stephen, 0H

Dannenberg, Florian, 02

Doi, K., 0N

Dong, Xin, 0L

Ellis, J. D., 0F

Froehly, L., 09

Gorecki, C., 09

Gronle, M., 09

Hahlweg, Cornelius, 02

Heist, Stefan, 05

Ignatovich, Filipp V., 0M

Jacobs-Perkins, D. W., 0F

Józwik, Michał, 0Q

Kaylor, Brant M., 0H

Kimbrough, Brad, 03

Kondo, K., 0N

Körner, K., 09

Krauter, J., 09

Kühmstedt, Peter, 05

Kujawińska, Małgorzata, 0Q

Lacey, Ian, 08

Leger, James R., 0G

L'Esperance, Drew, 0C, 0E

Li, Jie, 0P

Liang, Jin, 0D, 0P

Lin, Di, 0G

Liu, Yongqi, 0L

Liu, Zhigang, 0V

Lutzke, Peter, 05

Maehara, S., 0N

Marcus, Michael A., 0M

McKinney, Wayne R., 08

Mendoza, Albert, 04

Notni, Gunther, 05

Novak, Erik, 03

Novak, Matt, 07

Ohdaira, Y., 0N

Ohkawa, M., 0N

Osten, W., 09

Passilly, N., 09

Peroz, Christophe, 08

Perrin, S., 09

Pescoller, Lukas, 02

Reibel, Randy R., 0H

Ren, Maodong, 0D, 0P

Roos, Peter A., 0I

Saito, T., 0N

Sakamoto, S., 0N

Sato, T., 0N

Schiffern, John T., 04

Schmit, Joanna, 07

Takacs, Peter Z., 08

Tao, Long, 0V

Thorpe, Michael J., 0I

Tokutake, Y., 0N

Trolinger, James D., 0C, 0E

Wang, Lizhong, 0D

Wei, Bin, 0D, 0P

Weiß, Jürgen, 02

Yashchuk, Valeriy V., 08

Żak, Jakub, 0Q

Zhang, Weibo, 0V

Zhang, Ze, 0L

Conference Committee

Program Track Chair

  • H. Philip Stahl, NASA Marshall Space Flight Center (United States)

Conference Chairs

  • Erik Novak, 4D Technology Corporation (United States)

  • James D. Trolinger, MetroLaser, Inc. (United States)

Conference Program Committee

  • Anand Krishna Asundi, Nanyang Technological University (Singapore)

  • Jan Burke, Bremer Institut für angewandte Strahltechnik GmbH (Germany)

  • Claas Falldorf, Bremer Institut für angewandte Strahltechnik GmbH (Germany)

  • Sen Han, University of Shanghai for Science and Technology (China)

  • Kevin G. Harding, GE Global Research (United States)

  • Kate Medicus, Optimax Systems, Inc. (United States)

  • Matthew J. Novak, Bruker AXS, Inc. (United States)

  • Wolfgang Osten, Institut für Technische Optik (Germany)

  • Peter Roos, Bridger Photonics, Inc. (United States)

  • Robert A. Smythe, R.A. Smythe Management Consultants (United States)

  • Joe Wehrmeyer, Arnold Engineering Development Center (United States)

Session Chairs

  • 1 Surface Measurements

    Erik Novak, 4D Technology Corporation (United States)

  • 2 Techniques for Performance Characterization and Enhancement

    Peter Roos, Bridger Photonics, Inc. (United States)

  • 3 Strain, Flow, and Gradient Measurements

    Sen Han, University of Shanghai for Science and Technology (China)

  • 4 Volumetric and Distance Based Methods

    James D. Trolinger, MetroLaser, Inc. (United States)


The methods of optical metrology have advanced significantly since the times of the early interferometers of the late 19th century. Fast cameras and processing make a whole range of new methods available today for looking at everything from fine microstructures to large astronomical systems. This conference was designed to focus on optical methods beyond traditional white-light or monochromatic-laser interferometric methods to other means of making precision measurements as well as the many applications made possible by these advances. An emphasis was placed on discussions on how metrology helps solve critical problems and answer key questions in both science and industry.

We had many excellent contributions to the 2015 conference, our inaugural year. Papers fit into four main application categories: surface measurements; techniques for system performance characterization and enhancement; strain, flow, and gradient measurements; and finally volumetric and distance-based methods. Many optical metrology techniques were discussed, including Schlieren imaging, superresolution methods, Moire and fringe projection, dynamic interferometry, spectroscopic methods, multiple-wavelength interferometry, speckle systems, high-precision LADAR, and color-based techniques. Each technique can help solve unique problems, and all are advancing rapidly as the demands for precision metrology steadily increase as cost, lifetime, and performance needs become ever more challenging.

Erik Novak

James D. Trolinger

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9576", Proc. SPIE 9576, Applied Advanced Optical Metrology Solutions, 957601 (10 September 2015);

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