Paper
26 August 2015 Bond models in linear and nonlinear optics
D. E. Aspnes
Author Affiliations +
Abstract
Bond models, also known as polarizable-point or mechanical models, have a long history in optics, starting with the Clausius-Mossotti relation but more accurately originating with Ewald’s largely forgotten work in 1912. These models describe macroscopic phenomena such as dielectric functions and nonlinear-optical (NLO) susceptibilities in terms of the physics that takes place in real space, in real time, on the atomic scale. Their strengths lie in the insights that they provide and the questions that they raise, aspects that are often obscured by quantum-mechanical treatments. Statics versions were used extensively in the late 1960’s and early 1970’s to correlate NLO susceptibilities among bulk materials. Interest in NLO applications revived with the 2002 work of Powell et al., who showed that a fully anisotropic version reduced by more than a factor of 2 the relatively large number of parameters necessary to describe secondharmonic- generation (SHG) data for Si(111)/SiO2 interfaces. Attention now is focused on the exact physical meaning of these parameters, and to the extent that they represent actual physical quantities.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. E. Aspnes "Bond models in linear and nonlinear optics", Proc. SPIE 9584, Ultrafast Nonlinear Imaging and Spectroscopy III, 95840A (26 August 2015); https://doi.org/10.1117/12.2188400
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Nonlinear optics

Second-harmonic generation

Dielectrics

Data modeling

Crystals

Physics

Oscillators

RELATED CONTENT

Harmonic generation in 2D layered materials
Proceedings of SPIE (September 17 2014)
Effects of ordering on the optical properties of GaInP2
Proceedings of SPIE (October 20 2004)
Spectroscopic ellipsometry of TiO2/Si
Proceedings of SPIE (August 08 2003)

Back to Top