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2 September 2015 Front Matter: Volume 9588
This PDF file contains the front matter associated with SPIE Proceedings Volume 9588 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this proceedings:

Author(s), “Title of Paper,” in Advances in X-Ray/EUV Optics and Components X, edited by Shunji Goto, Christian Morawe, Ali M. Khounsary, Proceedings of SPIE Vol. 9588 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN:1996-756X (electronic)

ISBN: 9781628417548

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citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Adams, Bernhard, 0D

Antimonov, M., 0F

Attenkofer, Klaus, 0D

Bacco, Davide, 02

Barrett, R., 03

Bencivenga, Filippo, 02

Bennis, Daniel, 0D

Bond, Justin L., 0D

Cappuccio, G., 0E

Cloetens, P., 03

Corso, Alain Jody, 02

Craven, Christopher A., 0D

Dabagov, S. B., 0E

Dennetiere, D., 05

Do, A., 05

Döring, Florian, 08

Eberl, Christian, 08

Egawa, Satoru, 0L

Foley, Michael R., 0D

Gerlin, Francesca, 02

Gessini, Alessandro, 02

Giangrisostomi, Erika, 02

Giglia, A., 02

Gontier, D., 05

Goto, Shunji, 0G

Halahovets, Yuriy, 04

Hampai, D., 0E

Hedacq, S., 05

Higashi, Takahiro, 0L

Hodas, Martin, 04

Høghøj, P., 05

Jansma, W., 0F

Jergel, Matej, 04

Johnson, A., 0F

Khounsary, A., 0F

Krebs, Hans-Ulrich, 08

Kume, Takehiro, 0L

Lantelme, B., 03

Liedl, A., 0E

Majkova, Eva, 04

Masciovecchio, C., 02

Mimura, Hidekazu, 0A, 0L

Minot, Michael J., 0D

Morawe, Ch., 03

Motoyama, Hiroto, 0L

Nannarone, S., 02

Nardello, Marco, 02

O’Mahony, Aileen, 0D

Osterhoff, Markus, 08

Pace, E., 0E

Peffen, J.-Ch., 03

Pelizzo, Maria Guglielmina, 02

Pelletta, Marco, 04

Polese, C., 0E

Popecki, Mark A., 0D

Principi, Emiliano, 02

Renaud, Joseph M., 0D

Grudzinkski, J. J., 0F

Saito, Takahiro, 0A, 0L

Siffalovic, Peter, 04

Stavitski, Eli, 0D

Stochaj, Michael E., 0D

Takei, Yoshinori, 0L

Takeo, Yoko, 0A, 0L

Tessarolo, Enrico, 02

Troussel, Ph., 05

Vegso, Karol, 04

Vivo, A., 03

Weigland, S., 0F

Zhou, Z., 0F

Zuppella, Paola, 02

Conference Committee

Program Track Chairs

  • Ali M. Khounsary, X-ray Optics, Inc. (United States) and Illinois Institute of Technology (United States)

  • Ralph B. James, Brookhaven National Laboratory (United States)

Conference Chairs

  • Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

  • Christian Morawe, European Synchrotron Radiation Facility (France)

  • Ali M. Khounsary, X-ray Optics, Inc. (United States) and Illinois Institute of Technology (United States)

Conference Program Committee

  • Lucia Alianelli, Diamond Light Source Ltd. (United Kingdom)

  • Lahsen Assoufid, Argonne National Laboratory (United States)

  • Stefan Braun, Fraunhofer IWS Dresden (Germany)

  • Shih-Lin Chang, National Tsing Hua University (Taiwan)

  • Raymond Conley Jr., Argonne National Laboratory (United States)

  • Sultan B. Dabagov, Istituto Nazionale di Fisica Nucleare (Italy)

  • Christian David, Paul Scherrer Institut (Switzerland)

  • Hans M. Hertz, KTH Royal Institute of Technology (Sweden)

  • Werner H. Jark, Elettra-Sincrotrone Trieste S.C.p.A. (Italy)

  • George A. Kyrala, Los Alamos National Laboratory (United States)

  • Eric Louis, University Twente (Netherlands)

  • Carolyn A. MacDonald, University at Albany (United States)

  • Howard A. Padmore, Lawrence Berkeley National Laboratory (United States)

  • Ladislav Pina, Czech Technical University in Prague (Czech Republic)

  • Yuriy Ya Platonov, Rigaku Innovative Technologies, Inc. (United States)

  • Seungyu Rah, Pohang University of Science and Technology (Korea, Republic of)

  • Peter Revesz, Cornell University (United States)

  • Horst Schulte-Schrepping, Deutsches Elektronen-Synchrotron (Germany)

  • Regina Soufli, Lawrence Livermore National Laboratory (United States)

  • Stanislav Stoupin, Argonne National Laboratory (United States)

  • Akihiko Ueda, JTEC Corporation (Japan)

  • Joerg Wiesmann, Incoatec GmbH (Germany)

  • Makina Yabashi, RIKEN (Japan) and Japan Synchrotron Radiation Research Institute (Japan)

  • Kazuto Yamauchi, Osaka University (Japan)

  • Brian W. Yates, Canadian Light Source Inc. (Canada)

Session Chairs

  • 1 Multilayers

    Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

    Raymond Conley Jr., Argonne National Laboratory (United States)

  • 2 Focusing

    Ali M. Khounsary, X-ray Optics, Inc. (United States) and Illinois Institute of Technology (United States)

    Kazuto Yamauchi, Osaka University (Japan)

  • 3 Optics Development and Fabrication

    Christian Morawe, European Synchrotron Radiation Facility (France)

    Hidekazu Mimura, The University of Tokyo (Japan)

  • 4 Instruments and Imaging

    Ladislav Pina, Czech Technical University in Prague (Czech Republic)

    Shunji Goto, Japan Synchrotron Radiation Research Institute (Japan)

  • 5 Optics for Coherent Sources: Joint Session with Conferences 9588 and 9589

    Carmen S. Menoni, Colorado State University (United States)

    Ali M. Khounsary, X-ray Optics, Inc. (United States) and Illinois Institute of Technology (United States)


This volume contains papers presented at the conference on “Advances in X-Ray/EUV Optics and Components X,” which was held in San Diego, California, United States on 11–12 August 2015 as part of the SPIE 2015 International Symposium on Optics + Photonics.

The conference was composed of five oral sessions: Multilayers, Focusing, Optics Development and Fabrication, Instrumentation and Imaging, and Optics for Coherent Sources. The final session was held jointly with the conference on “X-ray Lasers and Coherent X-Ray Sources: Development and Application XI.”

The focus of the conference was technological developments in X-ray/EUV optics for synchrotron and FEL beamlines. Presentations covered a wide spectrum, from vacuum ultra violet to hard X-rays. Topics related to X-ray lasers, coherent X-ray sources, laboratory-based X-ray sources, and X-ray imaging were presented in independent conferences at the same symposium.

Scheduled for nearly one and a half days of oral presentations with an accompanying evening poster session, the conference was lively and well attended. We would like to thank the authors, speakers, session and joint session chairs, program committee members, the conference participants for their contributions, and the SPIE staff for their help in organizing the conference.

Shunji Goto

Christian Morawe

Ali M. Khounsary

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9588", Proc. SPIE 9588, Advances in X-Ray/EUV Optics and Components X, 958801 (2 September 2015);

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