Translator Disclaimer
31 August 2015 Design and implementation of a gated-laser entrance hole imaging diagnostic (G-LEH-1) at NIF
Author Affiliations +
Gated x-ray images through the laser entrance hole (LEH) of a hohlraum can provide critical information for ICF experiments at the National Ignition Facility (NIF), such as the size of the LEH vs time, the growth of the gold bubble1, and the change in the brightness of inner beam spots due to time-varying cross beam energy transfer2. Incorporating a high-speed multi-frame CMOS x-ray imager developed by Sandia National Laboratories3,4 into the existing Static X-ray Imager (SXI) diagnostic5 at NIF, the new Gated LEH Imager #1 (G-LEH-1) diagnostic is capable of capturing two to four LEH images per shot on its 1024x448 pixel photo detector array, with integration times as low as 2 ns per frame. The design of this diagnostic and its implementation on NIF will be presented.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nathan E. Palmer, Hui Chen, Jarom Nelson, Sukhdeep Heerey, Ken Piston, Mai Thao, Marilyn Schneider, Perry Bell, Dave Bradley, John Porter, John Stahoviak, Marcos Sanchez, and Liam Claus "Design and implementation of a gated-laser entrance hole imaging diagnostic (G-LEH-1) at NIF", Proc. SPIE 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV, 959106 (31 August 2015);

Back to Top