Translator Disclaimer
Paper
31 August 2015 Gated photocathode design for the P510 electron tube used in the National Ignition Facility (NIF) optical streak cameras
Author Affiliations +
Abstract
The optical streak cameras currently used at the National Ignition Facility (NIF) implement the P510 electron tube from Photonis1. The existing high voltage electronics provide DC bias voltages to the cathode, slot, and focusing electrodes. The sweep deflection plates are driven by a ramp voltage. This configuration has been very successful for the majority of measurements required at NIF. New experiments require that the photocathode be gated or blanked to reduce the effects of undesirable scattered light competing with low light level experimental data. The required ~2500V gate voltage is applied between the photocathode and the slot electrode in response to an external trigger to allow the electrons to flow. Otherwise the slot electrode is held approximately 100 Volts more negative than the potential of the photocathode, preventing electron flow. This article reviews the implementation and performance of the gating circuit that applies an electronic gate to the photocathode with a nominal 50ns rise and fall time, and a pulse width between 50ns and 2000ns.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Datte, G. James, P. Celliers, D. Kalantar, and G. Vergel de Dios "Gated photocathode design for the P510 electron tube used in the National Ignition Facility (NIF) optical streak cameras", Proc. SPIE 9591, Target Diagnostics Physics and Engineering for Inertial Confinement Fusion IV, 95910D (31 August 2015); https://doi.org/10.1117/12.2190224
PROCEEDINGS
13 PAGES


SHARE
Advertisement
Advertisement
Back to Top