18 September 2015 Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy
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Proceedings Volume 9592, X-Ray Nanoimaging: Instruments and Methods II; 95920U (2015); doi: 10.1117/12.2190749
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States
Abstract
X-ray fluorescence offers unparalleled sensitivity for imaging the nanoscale distribution of trace elements in micrometer thick samples, while x-ray ptychography offers an approach to image weakly fluorescing lighter elements at a resolution beyond that of the x-ray lens used. These methods can be used in combination, and in continuous scan mode for rapid data acquisition when using multiple probe mode reconstruction methods. We discuss here the opportunities and limitations of making use of additional information provided by ptychography to improve x-ray fluorescence images in two ways: by using position-error-correction algorithms to correct for scan distortions in fluorescence scans, and by considering the signal-to-noise limits on previously-demonstrated ptychographic probe deconvolution methods. This highlights the advantages of using a combined approach.
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Junjing Deng, David J. Vine, Si Chen, Youssef S. G. Nashed, Tom Peterka, Rob Ross, Stefan Vogt, Chris J. Jacobsen, "Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy", Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920U (18 September 2015); doi: 10.1117/12.2190749; http://dx.doi.org/10.1117/12.2190749
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KEYWORDS
X-rays

Deconvolution

X-ray imaging

Sensors

Data acquisition

Spatial resolution

X-ray microscopy

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