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Junjing Deng, David J. Vine, Si Chen, Youssef S. G. Nashed, Tom Peterka, Rob Ross, Stefan Vogt, Chris J. Jacobsen, "Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy," Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920U (18 September 2015);