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18 September 2015 Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials
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Abstract
Ptychography is an emerging high resolution coherent imaging technique which can improve the resolution of current scanning transmission X-ray microscopy systems by over ten-fold. Development of this capability is underway at Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, to establish sub-5 nm resolution ptychographic imaging with spatially resolved near-edge X-ray absorption fine structure spectroscopy. This is being achieved via an upgrade of the current soft X-ray scanning transmission X-ray microscope at beamline 13-1, involving the installation of an area detector and an interferometer system for high precision sample motor control. The undulator source on beamline 13-1 provides the spatially and temporally coherent X-ray beam required for ptychographic imaging in the energy range 500 – 1200 eV. This energy range allows access to the oxygen chemistry and the valence states of 3d transition metals found in energy storage materials, making soft x-ray ptychography a particularly powerful tool to study the chemical states and structure of battery materials at relevant length scales. The implementation of ptychographic imaging can therefore provide a wealth of additional information on battery operation and failure. Here we describe the development of this ptychography capability, along with its application to the study of energy storage materials.
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Anna M. Wise, Hendrik Ohldag, William Chueh, Joshua Turner, Michael F. Toney, and Johanna Nelson Weker "Development of a soft x-ray ptychography beamline at SSRL and its application in the study of energy storage materials", Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920B (18 September 2015); https://doi.org/10.1117/12.2188811
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