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18 September 2015 Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography
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Abstract
X-ray Bragg ptychography (XBP) is an experimental technique for high-resolution strain mapping in a single nano- and mesoscopic crystalline structures. In this work we discuss the conditions that allow direct interpretation of the ptychographic reconstructions in terms of the strain distribution obtained from the two dimensional (2D) XBP. Simulations of the 2D XBP experiments under realistic experimental conditions are performed with a model of InGaN/GaN core-shell nanowire with low (1%) and high (30%) Indium concentrations in the shell.
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Dmitry Dzhigaev, Tomaš Stankevič, Ilya Besedin, Sergey Lazarev, Anatoly Shabalin, Mikhail N. Strikhanov, Robert Feidenhans'l, and Ivan A. Vartanyants "Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography", Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods II, 95920S (18 September 2015); https://doi.org/10.1117/12.2190416
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