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Impact of thermal treatment on electrical characteristics and charge collection efficiency of Me-GaAs:Cr-Me x-ray sensors
High-barrier Schottky contact on n-type 4H-SiC epitaxial layer and studies of defect levels by deep level transient spectroscopy (DLTS)
A low-noise wide-dynamic-range event-driven detector using SOI pixel technology for high-energy particle imaging
Investigation of thermally evaporated high resistive B-doped amorphous selenium alloy films and metal contact studies
Defect characterization of Cd0.9Zn0.1Te crystals using electron beam induced current (EBIC) imaging and thermally stimulated current (TSC) measurements