24 August 2015 Recent progress and development of a speedster-EXD: a new event-triggered hybrid CMOS x-ray detector
Author Affiliations +
Abstract
We present the characterization of a new event-driven X-ray hybrid CMOS detector developed by Penn State University in collaboration with Teledyne Imaging Sensors. Along with its low susceptibility to radiation damage, low power consumption, and fast readout time to avoid pile-up, the Speedster-EXD has been designed with the capability to limit its readout to only those pixels containing charge, thus enabling even faster effective frame rates. The threshold for the comparator in each pixel can be set by the user so that only pixels with signal above the set threshold are read out. The Speedster-EXD hybrid CMOS detector also has two new in-pixel features that reduce noise from known noise sources: (1) a low-noise, high-gain CTIA amplifier to eliminate crosstalk from interpixel capacitance (IPC) and (2) in-pixel CDS subtraction to reduce kTC noise. We present the read noise, dark current, IPC, energy resolution, and gain variation measurements of one Speedster-EXD detector.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christopher V. Griffith, Christopher V. Griffith, Abraham D. Falcone, Abraham D. Falcone, Zachary R. Prieskorn, Zachary R. Prieskorn, David N. Burrows, David N. Burrows, } "Recent progress and development of a speedster-EXD: a new event-triggered hybrid CMOS x-ray detector", Proc. SPIE 9601, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XIX, 96010B (24 August 2015); doi: 10.1117/12.2186805; https://doi.org/10.1117/12.2186805
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT


Back to Top