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4 September 2015 Improved control and characterization of adjustable x-ray optics
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We report on improvements in our efforts to control and characterize piezoelectrically adjustable, thin glass optics. In the past, an optical profilometer and a Shack-Hartmann wavefront sensor have been used to measure influence functions for a at adjustable mirror. An electronics system has since been developed to control > 100 actuator cells and has been used in a full calibration of a high-yield at adjustable mirror. The calibrated influence functions have been used to induce a pre-determined figure change to the mirror, representing our first attempt at figure control of a full mirror. Furthermore, we have adapted our metrology systems for cylindrical optics, allowing characterization of Wolter-type mirrors. We plan to use this metrology to perform the first piezoelectric figure correction of a cylindrical mirror over the next year.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ryan Allured, Sagi Ben-Ami, Vincenzo Cotroneo, Vanessa Marquez, Stuart McMuldroch, Paul B. Reid, Daniel A. Schwartz, Susan Trolier-McKinstry, Alexey A. Vikhlinin, and Margeaux L. Wallace "Improved control and characterization of adjustable x-ray optics", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96031M (4 September 2015);

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