4 September 2015 Optical and x-ray alignment approaches for off-plane reflection gratings
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Abstract
Off-plane reflection gratings offer the potential for high-resolution, high-throughput X-ray spectroscopy on future missions. Typically, the gratings are placed in the path of a converging beam from an X-ray telescope. In the off-plane reflection grating case, these gratings must be co-aligned such that their diffracted spectra overlap at the focal plane. Misalignments degrade spectral resolution and effective area. In-situ X-ray alignment of a pair of off-plane reflection gratings in the path of a silicon pore optics module has been performed at the MPE PANTER beamline in Germany. However, in-situ X-ray alignment may not be feasible when assembling all of the gratings required for a satellite mission. In that event, optical methods must be developed to achieve spectral alignment. We have developed an alignment approach utilizing a Shack-Hartmann wavefront sensor and diffraction of an ultraviolet laser. We are fabricating the necessary hardware, and will be taking a prototype grating module to an X-ray beamline for performance testing following assembly and alignment.
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Ryan Allured, Ryan Allured, Benjamin D. Donovan, Benjamin D. Donovan, Casey T. DeRoo, Casey T. DeRoo, Hannah R. Marlowe, Hannah R. Marlowe, Randall L. McEntaffer, Randall L. McEntaffer, James H. Tutt, James H. Tutt, Peter N. Cheimets, Peter N. Cheimets, Edward Hertz, Edward Hertz, Randall K. Smith, Randall K. Smith, Vadim Burwitz, Vadim Burwitz, Gisela Hartner, Gisela Hartner, Benedikt Menz, Benedikt Menz, } "Optical and x-ray alignment approaches for off-plane reflection gratings", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 960315 (4 September 2015); doi: 10.1117/12.2186412; https://doi.org/10.1117/12.2186412
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