Lifetime evaluation of large format CMOS mixed signal infrared devices

A. Linder; Eddie Glines

doi:10.1117/12.2189358

Translator Disclaimer

1 September 2015 Lifetime evaluation of large format CMOS mixed signal infrared devices

A. Linder, Eddie Glines

Author Affiliations +

Proceedings Volume 9608, Infrared Remote Sensing and Instrumentation XXIII; 96080Y (2015) https://doi.org/10.1117/12.2189358
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

New large scale foundry processes continue to produce reliable products. These new large scale devices continue to use industry best practice to screen for failure mechanisms and validate their long lifetime. The Failure-in-Time analysis in conjunction with foundry qualification information can be used to evaluate large format device lifetimes. This analysis is a helpful tool when zero failure life tests are typical. The reliability of the device is estimated by applying the failure rate to the use conditions. JEDEC publications continue to be the industry accepted methods.

Citation Download Citation

A. Linder and Eddie Glines "Lifetime evaluation of large format CMOS mixed signal infrared devices", Proc. SPIE 9608, Infrared Remote Sensing and Instrumentation XXIII, 96080Y (1 September 2015); https://doi.org/10.1117/12.2189358

ACCESS THE FULL ARTICLE