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5 August 2015Design of four-mirror afocal principal system for wide field multichannel infrared imaging
The image space scanning system is widely used for multichannel infrared imaging to overcome the absence of large infrared focal plane array. The field of view of afocal system directly influences the time resolution of the image space scanning system. The field of view of afocal system is generally less than 7°. Therefore, it is significant to design larger field of view of afocal system for increasing time resolution. The method of four-mirror afocal system design based on primary aberration is explored. The structural parameters are calculated according to magnification and obscuration ratio of each mirror. The conic parameters are calculated according to primary aberration coefficients. The procedure for calculating initial structural parameters is programmed. Then a four-mirror afocal system is designed with an entrance pupil diameter of 200mm, a field of view of 20°×1°, the operating wave band of 3~12μm, compression ratio of 2.5 times and the distance of exit pupil of 620mm. The results indicate that the maximum root mean square (RMS) wavefront error is less than 0.042λ(λ=7.5μm), the maximum optical path difference(OPD) is less than λ/4(λ=3~12μm). It has high imaging quality and the modulation transfer function (MTF) is approached to the diffraction limit. The method of afocal system design can be widely used for wide field multichannel infrared imaging.
Bin Hu,Ying Huang, andYan Li
"Design of four-mirror afocal principal system for wide field multichannel infrared imaging", Proc. SPIE 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 96180D (5 August 2015); https://doi.org/10.1117/12.2190681
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Bin Hu, Ying Huang, Yan Li, "Design of four-mirror afocal principal system for wide field multichannel infrared imaging," Proc. SPIE 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 96180D (5 August 2015); https://doi.org/10.1117/12.2190681