5 August 2015 A nondestructive characterization system of periodically poled crystals
Author Affiliations +
Abstract
Periodically poled crystals are widely used as SHG, DFG, SFG, OPO and THz generation, and there is a broad application prospect in some areas such as the laser display, optical fiber communication, atmospheric exploration and military confrontation. At present, to get the parameters of periodically poled crystals, like duty ratio, the main method is chemical etching of the samples. In this paper, we present a nondestructive characterization system of periodically poled crystals. When we apply a proper high voltage on both sides of the periodically poled crystal, the refractive index difference of positive and negative domain will be increased and we can observe a clear domain pattern by the a microscope so as to obtain general information. Then a single frequency laser is prepared to radiate on +z surface of the periodically poled crystal, we can get some orders of diffraction according to diffraction optics principle. Finally, we can measure the parameters such as period, duty ratio by use of numerical analysis. The testing sample size of this system can be up to 60mm, The accuracy of the testing period can be 0.1μm, and the measurement range of duty ratio is 20%-50%.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huaixi Chen, Huaixi Chen, Huang Zhou, Huang Zhou, Liyuan Chen, Liyuan Chen, Xiaolin Zou, Xiaolin Zou, Long Miao, Long Miao, Xinkai Feng, Xinkai Feng, Guangwei Li, Guangwei Li, Wanguo Liang, Wanguo Liang, } "A nondestructive characterization system of periodically poled crystals", Proc. SPIE 9618, 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 96180Z (5 August 2015); doi: 10.1117/12.2193324; https://doi.org/10.1117/12.2193324
PROCEEDINGS
7 PAGES


SHARE
Back to Top