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13 August 2015 Front Matter: Volume 9623
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9623, including the Title Page, Copyright information, Table of Contents, Introduction, Authors, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, edited by Jigui Zhu, Hwa-Yaw Tam, Kexin Xu, Hai Xiao, Sen Han, Proceedings of SPIE Vol. 9623 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628418040

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Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Bai, Jian, 03, 1F

Bi, Chao, 0K

Cai, Chuan, 0S

Cai, Zhijian, OW

Cao, Xuedong, 0N

Chen, Lin, 0M, 0N

Chen, Xiaoyu, 03

Chen, Yan, 0J, 1I

Chen, Yang, 0F

Chen, Zhe, 0Z

Cui, Chengjun, 0E

Cui, Cunxing, 1B

Dong, Dengfeng, 0G

Dong, Hao, 1G, 1H

Dong, Liquan, 07, 09, 0D, 0R, 14

E, Kewei, 19

Fan, Tianquan, 0M

Fan, Zhen-zhong, 0K

Feng, Qibo, 1B

Feng, Wei, 1C

Fu, Luhua, 08, 0I, 0X, 16, 1E

Fu, Xiaoyu, 0H

Gan, Lu, 15

Gao, Chun-ming, 15

Gao, Mingxing, 0M, 0N

Ge, Chunfeng, 0H

Geng, Xin, 0Z

Gou, Jiansong, 10

Guo, Siyang, 0F

Guo, Yin, 0I

Guo, Youwei, 0X

Han, Peng, 18

Han, Ying, 0R

Hao, Bingtao, 0H

Hao, YunCai, 12

He, Qi-rui, 15

He, Shufang, 0J, 1I

He, Yingwei, 0S

He, Yong-qiang, 0Q

Healy, John J., 0Y

Hong, Baoyu, 0H

Hong, Tianqi, 0F

Hong, Zhihan, 19

Hu, Hong, 0V

Hu, Xinqi, 0A

Hu, Zhixiong, 0H

Huang, Yifan, 06

Huang, Zhe, 0F

Huang, Zhen, 0L

Hui, Mei, 07, 09, 0D, 14

Jia, Bingtian, 16

Jia, Dongfang, 0H

Jing, Hongwei, 0M, 0N

Kong, Lingqin, 0R

Lao, Dabao, 0E, 0G

Li, Chengxu, 19

Li, Dahai, 19

Li, Fei, 0A

Li, Feng, 0T

Li, Jie, 0M

Li, Jintao, 13

Li, Lin, 06

Li, Mengyang, 19

Li, Xinghui, 1G, 1H

Li, Xingqiang, 16

Li, Yang, 13

Li, Yanhong, 0R

Li, YaSheng, 0J, 1I

Li, Yonghui, 07, 14

Li, Zhen, 0V

Liang, Yiyong, 1F

Liao, Ningfang, 0J, 1I

Lin, Jiarui, 0B

Ling, Tong, 03

Liu, Changjie, 08, 0I, 16, 1E

Liu, Da, 12

Liu, Dingpu, 0S

Liu, Dong, 03

Liu, Guangyi, 02

Liu, Guodong, 0L

Liu, Haiqing, 08, 0B

Liu, Ming, 07, 09, 0D, 0R, 14

Liu, Shouqi, 1C

Liu, Weihua, 1B

Liu, Wenjing, 0X

Liu, Wenli, 0H

Liu, Wenlong, 13

Liu, Xiaohua, 07, 09, 0D, 14

Liu, Xintong, 0O

Liu, Yanlei, 1D

Liu, Yuankun, 1C

Liu, Yufang, 1D

Liu, Zhilong, 0C

Lu, Qianbo, 1F

Lu, Ruijun, 10

Lu, Zengxiong, 02

Luo, Kaiqing, 18

Lv, Dongdong, 13

Lv, Hang, 1I

Lyu, Hang, 0J

Meng, Haifeng, 0S

Meng, Qingbin, 02

Meng, Qingyu, 11

Mi, Yuhe, 06

Ni, Kai, 17, 1G, 1H

Ou, Guangli, 17

Qi, Yuejing, 02

Qian, Xiang, 17

Qiao, Lin, 1A

Qiu, Jian, 18

Qu, Xinghua, 0Z

Ren, Yongjie, 0B, 0F

Ren, Zhong, 0L

Sa, Renna, 0R

Shang, Mingnuo, 1E

Shao, Z. F., 0U

Shen, Xinlan, 10

Shen, Yibing, 03

Song, Zhijun, 1A

Su, Jiani, 02

Su, Yuling, 13, 1A

Su, Zhan, 1A

Sun, Changku, 0O, 0P

Sun, Pengfei, 0P

Sun, Qianqian, 0A

Tang, Yiming, 1A

Tian, Yi, 0R

Tong, Weichao, 0C

Wan, Lifang, 0J, 1I

Wan, Ruyi, 0V

Wang, Biao, 0C

Wang, Kai, 11

Wang, Kaiwei, 1F

Wang, Li, 0T, 12

Wang, Liqiang, 04

Wang, Peng, 0O, 0P

Wang, Shanshan, 11

Wang, Xiaohao, 17

Wang, Xinjie, 13, 1A

Wang, Yakun, 07, 14

Wang, Zhong, 0X, 10, 16

Wu, Guanhao, 1G, 1H

Wu, Jian, 04

Wu, Jianhong, OW

Wu, Xiaobin, 18

Wu, Y. Q., 0U

Xie, Linlin, 0S

Xiong, Limin, 0S

Xu, Jisen, 18

Xu, Kaipin, 1D

Xu, Mingfei, 1G, 1H

Yang, Hongzhi, 05

Yang, Jie, 0N

Yang, Linghui, 0B

Yang, Ma-ying, 0T

Yang, Que, 11

Yang, Suhui, 05

Yang, Yongying, 03

Yao, Youwei, 0V

Yu, Kun, 1D

Yu, Quan, 17

Yu, Zhou, 17

Yuan, Bo, 04

Zeng, Lvming, 0L

Zhai, Xiaohao, 07, 14

Zhai, Yusheng, 13, 1A

Zhang, Bifeng, 0S

Zhang, Chen, 19

Zhang, Chunyu, 11

Zhang, Dehua, 05

Zhang, Dong-xiao, 0Q

Zhang, Feng, 1D

Zhang, Fumin, 0Z

Zhang, Haijun, 0I

Zhang, Haiyang, 05

Zhang, Jinsong, 0V

Zhang, Jun, 12

Zhang, Junchao, 0S

Zhang, Kaihua, 1D

Zhang, Lei, 03

Zhang, Li, 0R

Zhang, Lu, 11

Zhang, Qican, 1C

Zhang, Sai, 1F

Zhang, Shiqi, 0D

Zhang, Wenying, 0E

Zhang, Xiaoguo, 17

Zhang, Xi-ren, 15

Zhang, Y. F., 0U

Zhang, Yan, 08

Zhang, Yihui, 0P

Zhang, Zhifeng, 13, 1A

Zhang, Zili, 0G

Zhao, Changming, 05

Zhao, Yuejin, 07, 09, 0D, 0R, 14

Zhao, Zhu, 0D

Zheng, Zheng, 05

Zhou, Bin, 1F,

Zhou, Peng, 07, 14

Zhou, Qian, 1G, 1H

Zhou, Tingting, 04

Zhou, Weihu, 0E, 0G

Zhou, Ying, 15

Zhu, Jigui, 0B

Zhu, Qiudong, 11

Zou, Wenlong, OW

Symposium Committee

General Chairs

  • Tianchu Li, National Institute of Metrology (China)

  • Toyohiko Yatagai, Utsunomiya University (Japan)

Conference Co-chairs

  • Yuri Chugui, New Siberia Academy of Sciences (Russian Federation)

  • Arthur Chiou, National Yang-Ming University (Taiwan, China)

  • Songlin Zhuang, Shanghai University of Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, CIS/Tianjin University (China)

  • Zheng You, Tsinghua University (China)

  • Guangjun Zhang, Beihang University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Co-chairs

  • Jinxue Wang, Raytheon Company (United States)

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Co-chairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Jianqiang Zhu, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • Daoyin Yu, Tianjin University (China)

  • Yanbiao Liao, Tsinghua University (China)

  • Yulin Xi, Beijing Hamamatsu Photon Techniques (China)

General Secretary

  • Xianfeng Zhu, China Instrument and Control Society (China)

Administrative Vice General Secretary

  • Yu-nan Sun, Beijing Institute of Technology (China)

Vice General Secretaries

  • Wei Xue, Beijing Institute of Technology (China)

  • Qun Hao, Beijing Institute of Technology (China)

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

Local Organizing Committee

  • Changming Zhao, Beijing Institute of Technology (China)

  • Yumei Wen, Chongqing University (China)

  • Hongda Chen, Institute of Semiconductors, CAS (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Zhiping Zhou, Peking University (China)

  • Xuping Zhang, Nanjing University (China)

  • Libo Yuan, Harbin Engineering University (China)

  • Chunqing Gao, Beijing Institute of Technology (China)

  • Shiqiao Qin, National University of Defense Technology (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

  • Liquan Dong, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Jigui Zhu, Tianjin University (China)

  • Hwa-Yaw Tam, The Hong Kong Polytechnic University (China)

  • Kexin Xu, Tianjin University (China)

  • Hai Xiao, Clemson University (United States)

  • Sen Han, University of Shanghai for Science and Technology (China)

Program Committee

  • Weihong Bi, Yanshan University (China)

  • Bukem Bilen, Bogazici University (Turkey)

  • Julian Chi Chiu Chan,Nanyang Technological University (Singapore)

  • Fengzhong Dong, Hefei Institute of Physical Science (China)

  • Bo Dong, Institute for Infocomm Research (Singapore)

  • Fajie Duan, Tianjin University (China)

  • Qibo Feng, Beijing Jiao Tong University (China)

  • Baiou Guan, Jinan University (China)

  • Young-Geun Han, Hanyang University (Korea, Republic of)

  • Emily Jianzhong Hao, Institute for Infocomm Research (Singapore)

  • Aaron H. P. Ho, Chinese University of Hong Kong (China)

  • Xuguang Huang, South China Normal University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Yange Liu, Nankai University (China)

  • Yunqi Liu, Shanghai University (China)

  • Bo Liu, Nankai University (China)

  • Xuefeng Liu, Nanjing University of Science and Technology (China)

  • Li Pei, Beijing Jiao Tong University (China)

  • Xiang Peng, Shenzhen University (China)

  • Osami Sasaki, Niigata University (Japan)

  • Liyang Shao, Carleton University (Canada)

  • Changku Sun, Tianjin University (China)

  • Tong Sun, City University London (United Kingdom)

  • Takamasa Suzuki, Niigata University (Japan)

  • Jiubin Tan, Harbin Institute of Technology (China)

  • Jian Wang, Focused Photonics Hangzhou, Inc. (China)

  • Yiping Wang, University of Southampton (United Kingdom)

  • Yuanhong Yang, Beihang University (China)

  • Changyuan Yu, National University of Singapore (Singapore)

  • Liandong Yu, Hefei University of Technology (China)

  • Aping Zhang, Zhejiang University (China)

  • Weiqian Zhao, Beijing Institute of Technology (China)

  • Chunliu Zhao, China Jiliang University (China)

  • Weihu Zhou, Academy of Opto-electronics, CAS (China)

  • Lianqing Zhu, Beijing Information Science and Technology University (China)

Secretary

  • Jiarui Lin, Tianjin University (China)

Session Chairs

  • 1 Optoelectronic Technology in Metrology

    Weihu Zhou, Academy of Opto-electronics, CAS (China)

  • 2 Optoelectronic Measurement and Detection

    Weihu Zhou, Academy of Opto-electronics, CAS (China)

  • 3 Optoelectronic Instruments and Systems I

    Zonghua Zhang, Hebei University of Technology (China)

  • 4 Optoelectronic Instruments and Systems II

    Qibo Feng, Beijing Jiao Tong University (China)

  • 5 Optoelectronic Instruments and Systems III

    Changku Sun, Tianjin University (China)

Introduction

The optoelectronic principle plays an outstanding role in the field of metrology and testing areas, as it provides an important method for the development of measurement technology. With the rapid development of information and measurement technology, systems that obtain sources of information have drawn much attention. New measurement requirements appear constantly, which promote continuous development of the optoelectronic measurement method, technology, and application, as well as bring vigor and vitality to the research on optoelectronic measurement.

Optoelectronic measurement research covers a range of content, from scientific research to that of the manufacturing industry and daily life. The aim will be to continue expanding and gathering content. Traditional optoelectronic measurement research and applications have been consistently improving in the field of industrial manufacturing precision measurement technology and concerned performances. Furthermore, the needs of optoelectronic measurement represented in the measurement of digital cultural heritage and environment protection have been emerging ceaselessly alongside the development of measuring methods and applications.

A total of 53 papers are included in these proceedings from the Optoelectronic Measurement Technology and System branch of OIT’ 2015. The papers apply to research fields including: optoelectronic measurement, optical instruments, industrial measurement, grating projection, spectral measurement, and optical fiber measurement. These papers appropriately reflect the current focus and research level of the optoelectronic measurement field.

Jigui Zhu

Hwa-Yaw Tam

Kexin Xu

Hai Xiao

Sen Han

Sponsors and Cooperating Organizations

Sponsored by

CIS—China Instrument and Control Society (China)

SPIE

  • Cooperating Organizations

  • Opto-Electronic-Mechanic Technology and System Integration Chapter, CIS (China)

  • Committee on Optoelectronic Technology, COS (China)

  • Optical Instrument Chapter, CIS (China)

  • Committee on Optics, China Ordnance Society (China)

  • Beijing Institute of Technology (China)

  • Tianjin University (China)

  • Zhejiang University (China)

  • Tsinghua University (China)

  • Nankai University (China)

  • Capital Normal University (China)

  • Nanjing University (China)

  • Shanghai Jiao Tong University (China)

  • Beijing University of Posts and Telecommunications (China)

  • Chongqing University (China)

  • University of Shanghai for Science and Technology (China)

  • Beijing Hamamatsu Photon Techniques Inc. (China)

  • Instrument Society of America (United States)

  • Institute of Measurement and Control (United Kingdom)

  • Hong Kong Institution of Engineers (Hong Kong China)

  • The Society of Measurement and Control (Japan)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9623", Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 962301 (13 August 2015); https://doi.org/10.1117/12.2208222
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