A new pose measurement system based on orthogonal beam splitting imaging configuration

Xintong Liu; Changku Sun; Peng Wang

doi:10.1117/12.2189026

7 August 2015 A new pose measurement system based on orthogonal beam splitting imaging configuration

Xintong Liu; Changku Sun; Peng Wang

Author Affiliations +

Proceedings Volume 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 96230O (2015) https://doi.org/10.1117/12.2189026
Event: International Conference on Optical Instruments and Technology 2015, 2015, Beijing, China

Abstract

A new pose measurement system based on orthogonal beam splitting imaging is proposed in this paper to solve the contradictions between the measurement accuracy and measurement speed in the existing pose measurement method of monocular or binocular vision with multi-linear CCDs. In the system, monocular object lens with beam splitting structure and two linear CCDs are combined to compose the pose measurement sensor. Monocular camera helps the system gain a large field of view. And the two orthogonally placed linear CCDs are equal to one array CCD. Furthermore, linear CCD possesses the advantage of high-resolution imaging, high-speed data capturing and high-efficiency data processing as compared to an array one. The key work of this paper lies in designing the optical structure of the sensor, calibrating the parameters of the camera corresponding to its model, and solving pose of the object by corresponding position algorithm. The experimental results prove that the measurement accuracy (2%) of orthogonally-splitting-imaging pose sensor can be achieved. Hence, this system meets the high-speed and high-precision measurement requirements in wide space and can be applied to pose measurement in aerospace and vehicle field.

Citation Download Citation

Xintong Liu, Xintong Liu, Changku Sun, Changku Sun, Peng Wang, Peng Wang, } "A new pose measurement system based on orthogonal beam splitting imaging configuration", Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230O (7 August 2015); doi: 10.1117/12.2189026; https://doi.org/10.1117/12.2189026

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