Apparatus and method of optical marker projection for the three-dimensional shape measurement

Zhe Chen; Xinghua Qu; Xin Geng; Fumin Zhang

doi:10.1117/12.2192678

7 August 2015 Apparatus and method of optical marker projection for the three-dimensional shape measurement

Zhe Chen, Xinghua Qu, Xin Geng, Fumin Zhang

Proceedings Volume 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 96230Z (2015) https://doi.org/10.1117/12.2192678
Event: International Conference on Optical Instruments and Technology 2015, 2015, Beijing, China

Abstract

Optical photography measurement and three-dimensional (3-D) scanning measurement have been widely used in the field of the fast dimensional and surface metrology. In the measurement process, however, retro-reflective markers are often pasted on the surface in advance for image registration and positioning the 3-D measuring instruments. For the large-scale workpiece with freeform surface, the process of pasting markers is time consuming, which reduces the measurement efficiency. Meanwhile, the measurement precision is impaired owing to the thickness of the marker. In this paper, we propose a system that projects two-dimensional (2-D) array optical markers with uniform energy on the surface of the workpiece instead of pasting retro-reflective markers, which achieves large-range and automated optical projection of the mark points. In order to conjunction with the 3-D handheld scanner belonging to our team, we develop an apparatus of optical marker projection, which is mainly composed of the high-power laser, the optical beam expander system, adjustable aperture stop and Dammann grating of dibasic spectrophotometric device. The projection apparatus can achieve the function of beams of 15 * 15 uniformly light of the two-dimensional lattice. And it’s much cheaper than the existing systems.

Citation Download Citation

Zhe Chen, Xinghua Qu, Xin Geng, and Fumin Zhang "Apparatus and method of optical marker projection for the three-dimensional shape measurement", Proc. SPIE 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 96230Z (7 August 2015); https://doi.org/10.1117/12.2192678

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
9 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

3D metrology

3D scanning

Projection systems

Beam expanders

Light emitting diodes

Laser marking

Optical arrays

Show All Keywords

Keywords/Phrases

Search In:

Publication Years