Investigating murals with terahertz reflective tomography

Minjie Yuan; Wenfeng Sun; Xinke Wang; Sen Wang; Qunxi Zhang; Jiasheng Ye; Yan Zhang

doi:10.1117/12.2190174

12 August 2015 Investigating murals with terahertz reflective tomography

Minjie Yuan, Wenfeng Sun, Xinke Wang, Sen Wang, Qunxi Zhang, Jiasheng Ye, Yan Zhang

Proceedings Volume 9625, 2015 International Conference on Optical Instruments and Technology: Terahertz Technologies and Applications; 962507 (2015) https://doi.org/10.1117/12.2190174
Event: International Conference on Optical Instruments and Technology 2015, 2015, Beijing, China

Abstract

Terahertz time-domain spectroscopy (THz-TDS) imaging technology has been proposed to be used in the non-invasive detection of murals. THz-TDS images provide structural data of the sample that cannot be obtained with other complementary techniques. In this paper, two types of defects hidden in the plaster used to simulate the cases of defects in the murals, have been investigated by the terahertz reflected time domain spectroscopy imaging system. These preset defects include a leaf slice and a slit built in the plaster. With the terahertz reflective tomography, information about defects has been determined involving the thickness from the surface of sample to the built-in defect, the profile and distribution of the defect. With this THz tomography, different defects with the changes of optical thickness and their relative refractive index have been identified. The application of reflective pulsed terahertz imaging has been extended to the defect detection of the murals.

Citation Download Citation

Minjie Yuan, Wenfeng Sun, Xinke Wang, Sen Wang, Qunxi Zhang, Jiasheng Ye, and Yan Zhang "Investigating murals with terahertz reflective tomography", Proc. SPIE 9625, 2015 International Conference on Optical Instruments and Technology: Terahertz Technologies and Applications, 962507 (12 August 2015); https://doi.org/10.1117/12.2190174

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