Paper
6 October 2015 Multispectral thin film coating on infrared detector
Meihdi Oussalah, Fabien Pradal, Benjamin Portier, Daniel Mouricaud, Hervé Sik, Joel Fleury, Patrice Laprat
Author Affiliations +
Abstract
High end applications in infrared may benefit from infrared colorimetry. Actual systems are designed using filter wheel, gratings or dichroic components. Those systems are bulky, do not allow real-time acquisition and are sensitive to stray light.

Sagem & Reosc recently developed technologies to pixelate infrared coating filters at detector level. It allows designing very compact systems, easy to cool down and to significantly reduce ghost images. Optical systems are simplified and can achieve fast acquisition of multi-spectral video.

Numerical simulations have been performed in order to quantify the pattern shape influence on the optical performances at the microscopic scale. The etching processes of multilayer stacks have been developed. Finally, prototypes have been manufactured and tested.

This technology opens up new perspectives in the field of infrared filtering.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Meihdi Oussalah, Fabien Pradal, Benjamin Portier, Daniel Mouricaud, Hervé Sik, Joel Fleury, and Patrice Laprat "Multispectral thin film coating on infrared detector", Proc. SPIE 9627, Optical Systems Design 2015: Advances in Optical Thin Films V, 96271W (6 October 2015); https://doi.org/10.1117/12.2190981
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Coating

Optical filters

Sensors

Staring arrays

Infrared detectors

Infrared sensors

Optical filtering

RELATED CONTENT

Progress in thin film coating on space IR detectors
Proceedings of SPIE (July 12 2019)
Comparison of two types of optical systems for space borne...
Proceedings of SPIE (September 08 2011)
Uncooled multispectral detectors
Proceedings of SPIE (October 26 1998)
Point Source Location Sensitivity Analysis
Proceedings of SPIE (November 06 1986)

Back to Top