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This PDF file contains the front matter associated with SPIE Proceedings Volume 9628, including the Title Page, Copyright information, Table of Contents, Invited Panel Discussion, and Conference Committee listing.

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Author(s), “Title of Paper,” in Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, edited by Angela Duparré, Roland Geyl, Proceedings of SPIE Vol. 9628 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781628418170

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.


Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abe, Shingo, 1K

Adinda-Ougba, A., 18

Aketagawa, Masato, 1D

Alonso, José, 1I

Beaumont, Dave, 1N

Beier, Matthias, 0U

Beutler, A., 12

Bischoff, Ch., 1P

Blobel, G., 12

Bollgrün, Patrick, 1R

Booij, Silvia, 1N

Braun, Stefan, 04

Brinkers, S., 0O

Callewaert, M., 22

Campos-García, Manuel, 16, 1B, 1E

Chen, Jie, 1O

Chen, Meixiong, 1A

Cheng, Xinbin, 1O

Choi, Samuel, 1K

Ciprian, D., 1W

Cossio-Guerrero, Cesar, 1B

De Malsche, W., 22

de Zwart, Siebe, 1N

Deng, Xiao, 1O

Díaz Garrido, Francisco, 1G

Díaz-Uribe, Rufino, 16, 1E

Dietrich, Volker, 0T

Döhring, Thorsten, 09

Dukwen, Julia, 1M

Eberhardt, Jörg, 1H

Endo, Katsuyoshi, 14

Endo, Kazumasa, 13

Faehnle, Oliver, 07

Falkner, Matthias, xi

Fasold, Stefan, xi

Felipe-Sesé, Luis A., 1G

Ferrario, Ivan, 06

Franta, Daniel, 0C, 0F, 0R, 1U

Friedrich, Peter, 09

Fuchs, Ulrike, 13

Gebhardt, Andreas, 0U

Gerhardt, N. C., 18

Ghislanzoni, Riccardo, 06

Giglia, Angelo, 1U

Gleissner, Uwe, 1R

Gómez-Pedrero, José A., 1I

Gomis Bresco, Jordi, 1Q

Gommans, Hans, 1N

Gong, Qingqing, 09

Granados Agustin, F., 16 Grau, M., 1P

Groote-Schaarsberg, J., 0O

Gür, B., 0O

Haase, Anton, 04

Hahne, F., 0X

Hartmann, Peter, 11

Hartung, Johannes, 0U

Heinisch, J., 0X

Heinrich, A., 1J

Hermerschmidt, Andreas, 1M

Herzig, Hans Peter, 1M

Hlubina, P., 1W

Hofmann, M. R., 18

Hofmann, Meike, 1R

Holbrouck, Piet, 06

Hu, Haixiang, 0S

Huang, Yun, 0Q

Huerta-Carranza, Oliver, 1B, 1E

Jankuj, Jiří, 0F

Jansen, R., 0O

Jedamzik, Ralf, 0T, 11

Jensen, Lars O., 0G, 0N

Jia, Xin, 19

Jiang, Wenbo, 1A

Jiang, Yadong, 17

Kabir, B., 18

Kadkhoda, P., 0N

Kadulova, M., 1W

Kim, Dong-Ik, 15

Kim, Geon Hee, 15

Kim, Ghiseok, 15

Kiontke, Sven R., 13

Kitayama, Takao, 14

Klus, Jakub, 0P

Koukourakis, N., 18

Kreuzer, Martin, 1Q

Krijn, Marcel, 1N

Kudo, Ryota, 14

Langehanenberg, P., 0X

Li, Tongbao, 1O

Li, Yun, 19

Lietz, Henrik, 1H

Liu, Jie, 1O

Liu, Zhixiang, 17

Lotz, M., 12

Luo, Xiao, 0S

Lv, Baobin, 17

Ma, Yan, 1O

Maillard, P., 1J

Meguellati, S., 1X

Menzel, Christoph, xi

Mika, S., 12

Mikš, A., 1Z

Militky, J., 1W

Mitschker, F., 18

Moreno-Oliva, Víctor Iván, 1B, 1E

Mühlig, S., 12

Muñoz Potosi, A., 16

Nádaský, Pavel, 0P, 0R

Nakano, Motohiro, 14

Nakatani, Shun, 14

Nečas, David, 0C, 0F, 0R, 1U

Nehse, U., 12

Novák, J., 1Z

Novák, P., 1Z

Ohlídal, Ivan, 0C, 0F, 0R, 1U

Ohlídal, Miloslav, 0C, 0P, 0R

Okita, Kenya, 14

Okuda, Kohei, 14

Opat, J., 1Z

Otter, G., 0O

Ottevaere, H., 22

Pearson, John L., 0W

Pertsch, Thomas, xi

Peschel, Thomas, 0U

Petzold, Uwe, 11

Pijlman, Fetze, 1N

Piñeiro-Ave, José, 1G

Plöger, Sven, 1M

Pokorný, P., 1Z

Prater, Karin, 1M

Proserpio, Laura, 09

Quirgoa, Juan A., 1I

Rädel, U., 1P

Rees, Paul C. T., 0W

Reichel, Steffen, 11

Risse, Stefan, 0U

Ristau, Detlev, 0G, 0N

Ritucci, Antonio, 06

Roberts, Gareth W., 0W

Rockstuhl, Carsten, xi

Rodríguez-Ibañez, Diego, 1I

Rossi, Massimiliano, 06

Sanders, Rene, 1N

Scharf, Toralf, 1M

Schmidt, Thomas, 1R

Schmitt, J., 1P

Scholze, Frank, 04

Sepkhanov, Ruslan, 1N

Sherman, Stanislav, 1R

Siegmann, Philip, 1G

Siepmann, J., 12

Sledzinska, Marianna, 1Q

Soltwisch, Victor, 04

Sotomayor Torres, Clivia M., 1Q

Staude, Isabelle, xi

Stollenwerk, Manfred, 09

Stover, John C., 0K

Šustek, Štěpán, 0P

Suzuki, Takamasa, 1K

Taccola, Matteo, 06

Tan, Zhongqi, 0Q

Terraneo, Marco, 06

Thienpont, H., 22

Thompson, Samantha J., 0W

Tian, Wei, 1A

Tokuta, Yusuke, 14

Valdivieso-González, L. G., 16

van der Schaft, Hans, 1N

Van Erps, J., 22

Verschooten, T., 22

Vervaeke, M., 22

Vižd’a, František, 0R

Vodák, Jirí, 0C, 0P, 0R

Völklein, F., 1P

Vu, Thanh-Tung, 1D

Wallrabe, U., 1P

Walther, Benny, xi

Wang, Jue, 0Y

Wickenhagen, Sven, 13

Wiegmann, A., 12

Wilde, C., 0X

Winter, Anita, 09

Wu, Suyong, 0Q

Xiao, Yanfen, 1R

Xie, Weimin, 19

Xing, Tingwen, 17, 19

Xu, Fuchao, 17, 19

Xu, Guangming, 1A

Yadwad, Harshwadhan, 0T

Yamamura, Kazuya, 14

Yamazaki, Ryo, 1D

Youngworth, Richard N., 13

Yuan, Jie, 1A

Zappe, Hans, 1R

Zeng, Xuefeng, 0S

Zhang, Xiaobao, 0Q

Zhang, Xuejun, 0S

Zhang, Yibo, 0Q

Zocchi, Fabio E., 06

Conference Committee

Symposium Chair

  • Wilhelm Ulrich, Carl Zeiss AG (Germany)

Symposium Co-chairs

  • Juan Carlos Miñano, Universidad Politénica de Madrid (Spain)

  • David M. Williamson, Nikon Research Corporation of America (United States)

Honorary Symposium Chair

  • Tina Kidger, Kidger Optics Associates (United Kingdom)

Conference Chairs

  • Angela Duparré, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Roland Geyl, REOSC (France)

Conference Programme Committee

  • Genevieve M. Chabassier, Commissariat à l’Énergie Atomique (France)

  • J. P. Chauveau, Essilor International (France)

  • Xinbin Cheng, Tongji University (China)

  • Svetlana Dligatch, Commonwealth Scientific and Industrial Research Organisation (Australia)

  • Sead Doric, Doric Lenses Inc. (Canada)

  • Pierre Gloesener, AMOS Ltd. (Belgium)

  • Philippe Godefroy, Winlight System S.A. (France)

  • James E. Harvey, Photon Engineering LLC (United States)

  • François Houbre, Savimex (France)

  • Shay Joseph, Rafael Advanced Defense Systems Ltd. (Israel)

  • Miloslav Ohlídal, Brno University of Technology (Czech Republic) Manfred Prantl, Alicona Imaging GmbH (Austria)

  • Sven Schroeder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Reinhard Völkel, SUSS MicroOptics SA (Switzerland)

  • Lingli Wang, Jos. Schneider Optische Werke GmbH (Germany)

  • Alexander Yascovich, Space Research Institute (Russian Federation)

Session Chairs

  • 1 Lithography and Space Optics I

    Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • 2 Lithography and Space Optics II

    Angela Duparré, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • 3 Characterisation of Coatings

    Angela Duparré, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • 4 Laser Damage, Defects, and Contaminations

    Xinbin Cheng, Tongji University (China)

  • 5 Light Scattering

    Sven Schröder, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • 6 Spectrophotometry

    Lars O. Jensen, Laser Zentrum Hannover e.V. (Germany)

  • 7 Manufacturing and Testing I

    Roland Geyl, REOSC (France)

  • 8 Manufacturing and Testing II

    Claude Amra, Centre national de la recherche scientifique (France)

  • 9 Aspheres

    Pierre Gloesener, AMOS Ltd. (Belgium)

  • 10 Interferometry

    Massimiliano Rossi, Media Lario Technologies S.r.l. (Italy)

  • 11 3D and Shape Metrology I

    Miloslav Ohlídal, Brno University of Technology (Czech Republic)

  • 12 3D and Shape Metrology II

    Roland Geyl, REOSC (France)

  • 13 Micro- and Nanostructures

    John C. Stover, The Scatter Works Inc. (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9628", Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 962801 (6 October 2015);

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