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24 September 2015 Scattermeter for measurement of solar cells
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Abstract
Scattermeter II is the second generation device designed and built at The Institute of Physical Engineering, Faculty of Mechanical Engineering, Brno University of Technology. This device has been designed for measuring the angular distribution of the intensity of electromagnetic radiation scattered from a surface of a solid. In this paper, the basic scheme of Scattermeter II and measuring principles with it are described. The results achieved in electromagnetic radiation scattering from surfaces of selected samples of single crystalline silicon wafers used in solar cells are also presented.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel Nádaský, Jakub Klus, Jiří Vodák, Štěpán Šustek, and Miloslav Ohlídal "Scattermeter for measurement of solar cells", Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 96280P (24 September 2015); https://doi.org/10.1117/12.2190779
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