Effective method for extracting aspheric parameters inherent in unknown aspheric surfaces

Dong-Ik Kim; Ghiseok Kim; Geon Hee Kim

doi:10.1117/12.2190503

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24 September 2015 Effective method for extracting aspheric parameters inherent in unknown aspheric surfaces

Dong-Ik Kim, Ghiseok Kim, Geon Hee Kim

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Proceedings Volume 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V; 962815 (2015) https://doi.org/10.1117/12.2190503
Event: SPIE Optical Systems Design, 2015, Jena, Germany

Abstract

In this paper, we propose an effective method for extracting the important parameters like radius of curvature, conic constant, and deformation coefficients indwelling unknown aspheric surfaces. These parameters can be inversely found from measured data by using the method that is based on aspheric equations and conic surfaces. To demonstrate the precision of the method, it is compared with a higher-order polynomial curve fit, employing two different examples. In a theoretical case, each largest fitting error (or shape error) resulted from the two methods appears a significant difference in precision. Lastly, we apply the proposed method to a real example and show the results.

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Dong-Ik Kim, Ghiseok Kim, and Geon Hee Kim "Effective method for extracting aspheric parameters inherent in unknown aspheric surfaces", Proc. SPIE 9628, Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V, 962815 (24 September 2015); https://doi.org/10.1117/12.2190503

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