23 November 2015 Laser damage resistance of optical components in sub-picosecond regime in the infrared
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Abstract
A rasterscan procedure is set to determine laser-induced damage densities in sub-picosecond regime at 1053nm on high-reflective coatings. Whereas laser-induced damage is usually considered deterministic in this regime, damage events occur on these structures for fluences lower than their intrinsic Laser-Induced Damage Threshold (LIDT). Damage densities are found to be high even for fluences as low as 20% of the LIDT. Scanning Electron Microscope observations of these “under threshold” damage sites evidence ejections of defects, embedded in the dielectric stack. It brings a new viewpoint for the qualification of optical components and for the optimization of manufacturing processes of coatings.
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Martin Sozet, Martin Sozet, Jérôme Néauport, Jérôme Néauport, Eric Lavastre, Eric Lavastre, Nadja Roquin, Nadja Roquin, Laurent Gallais, Laurent Gallais, Laurent Lamaignère, Laurent Lamaignère, } "Laser damage resistance of optical components in sub-picosecond regime in the infrared", Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96320N (23 November 2015); doi: 10.1117/12.2194286; https://doi.org/10.1117/12.2194286
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