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23 November 2015 Single-shot femtosecond laser ablation of copper: experiment vs. simulation
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Abstract
Single 5 and 40 femtosecond, near IR pulses with fluences varying from 0.4 – 80 J/cm2 from a Ti:Sapphire laser was focused onto a single crystal Cu sample surface with 2.0 μm focal spot at 15 and 45 degree angle of incidence. The surface profiles after interaction were studied with an interferometric depth profiler (Wyko NT9100), and benchmarked against crater size and morphology predicted by 2D Particle-In-Cell (PIC) laser damage simulation model.
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Enam Chowdhury, Kyle Kafka, Robert Mitchell, Alex M. Russell, Kevin Werner, Noah Talisa, Hui Li, Allen Yi, and Douglass Schumacher "Single-shot femtosecond laser ablation of copper: experiment vs. simulation", Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96320R (23 November 2015); https://doi.org/10.1117/12.2195787
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