23 November 2015 Analysis of cumulative versus ISO-recommended calculation of damage probability using a database of real S-on-1 tests
Author Affiliations +
Abstract
Data collected in real S-on-1 LIDT experiments performed with a nanosecond, 1064 nm automated station are used to calculate the damage probability with the ISO-recommended (conventional) method and the recently-suggested cumulative method. The damage probability points versus fluence for each type of calculation are fitted using both, linear and nonlinear curves. The resultant four data sets corresponding to each real experiment are used to compare important parameters as: statistical uncertainty of damage probability points, fitting errors, damage threshold fluences for actual number of pulses, and the extrapolated threshold fluences for very large number of pulses. We suggest and analyze also a limit case of the cumulative method, when the damage probability points are calculated for each interrogated site. Both, the recently-suggested cumulative method, and our limit case, look very promising.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alexandru Zorila, Alexandru Zorila, Aurel Stratan, Aurel Stratan, Ioana Dumitrache, Ioana Dumitrache, Laurentiu Rusen, Laurentiu Rusen, George Nemes, George Nemes, } "Analysis of cumulative versus ISO-recommended calculation of damage probability using a database of real S-on-1 tests", Proc. SPIE 9632, Laser-Induced Damage in Optical Materials: 2015, 96321H (23 November 2015); doi: 10.1117/12.2194303; https://doi.org/10.1117/12.2194303
PROCEEDINGS
9 PAGES


SHARE
RELATED CONTENT


Back to Top