23 October 2015 Front Matter: Volume 9633
Proceedings Volume 9633, Optifab 2015; 963301 (2015) https://doi.org/10.1117/12.2222197
Event: SPIE Optifab, 2015, Rochester, New York, United States
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9633 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.
Bentley and Sebastian: Optifab 2015

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings: Author(s), “Title of Paper,” in Optifab 2015, edited by Julie L. Bentley, Sebastian Stoebenau, Proceedings of SPIE Vol. 9633 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN:1996-756X (electronic)

ISBN: 9781628418385

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Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume.

Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B...0Z, followed by 10-1Z, 20-2Z, etc.

Abel-Tiberini, Laetitia, 21

Abou-El-Hossein, Khaled, 1I, 1J

Aguirre-Aguirre, D., 1P, 1Z, 24

Aharon, Oren, 28

Allen, M. A., 0Z

Ament, Craig, 10

Ayomoh, M., 1I

Bagwell, Joel, 10, 1L, 1V

Bai, Jian, 1Q, 1R, 2A, 2D

Bartlett, Kevin, 0D

Bauer, Aaron, 16

Bechtold, Michael J., 0L

Bechtold, Rob, 0L

Beier, Matthias, 11, 13

Benea, Ion C., 06

Berger, G., 1O

Berthon, Jacques, 21

Beutler, A., 19

Bissacco, Giuliano, 0B

Boffa, Christopher C., 05

Bolton, J., 0Z

Boucher, W., 1T, 1U

Bourgeade, Antoine, 0A

Bourgeois, G., 1T

Bradu, A., 0Q

Brahmi, D., 1U

Bremer, Mark, 0V

Brophy, Matthew R., 0D

Brunelle, Matt, 18

Burkam, Eric, 06

Burmeister, Frank, 13

Butler, Sam C., 2E

Cahill, Michael J., 0L

Campaignolle, S., 08

Canavesi, Cristina, 0O

Cao, Jun, 2O

Carrasco-Licea, E., 1P, 24

Cavaro, Sandy, 0A

Cernat, R., 0Q

Chen, Guanglin, 09

Cheng, Yuan-Chieh, 1J

Chong, Shiyao, 1Q, 1R, 2D

Cirucci, Nick, 0P

Cogliati, Andrea, 0O

Compertore, David, 1W, 1X

Cook, Chris, 10

Cormont, Philippe, 0A

Cruz-Zavala, E., 1P

Dahl, R. J., 0Z

Danger, Thomas, 1E

Davis, Johnathan M., 0Y

DeFisher, Scott, 1D, 1G, 1M

DeGroote Nelson, Jessica, 0D, 18, 1F

Demian, D., 0Q

Deprez, M., 1T, 1U

Devries, Gary, 1N

Dobre, G., 0Q

Doualle, Thomas, 0A

Duma, V.-F., 0Q

Dumas, Paul, 0G

Dun, Aihuan, 2O

Eberhardt, Ramona, 13

Ellis, Jonathan D., 2E

Endo, Katsuyoshi, 1B

Escolas, John, 0C

Feidenhans'l, Nikolaj A., 0B

Feldkamp, Roman, 0E

Fess, Edward, 0H, 0L, 1D, 1G, 1M

Gaborit, Gael, 0A

Gallais, Laurent, 0A

Gangadhara, Sanjay, 0W

Gascon, A., 1U

Gay, Shawn C., 0W

Gebhardt, Andreas, 11, 13

Ghobashy, Sameh, 1J

Giannechini, L. J., 07

Gibson, Donald S., 1W

Girard, Luc, 0V

Golini, N., 07

Granados-Agustín, F. S., 1P, 24

Hagen, Jeffery R., 0Y

Hahne, Felix, 14

Hall, Christopher A., 0F

Han, Jeong-Yeol, 25

Hansen, Poul-Erik, 0B

Hardy, Sam, 0V

Hartung, Johannes, 13

Hayes, Adam, 0O

Heidrich, Sebastian, 03

Heinisch, Josef, 14

Herbrand, Matthew E., 1W

Ho, Cheng-Fang, 15, 26

Hobbs, Zachary, 0C

Hoffmann, Nathan N., 0C

Homassel, E., 1T

Hooper, Abigail R., 05, 0C

Hsu, Ming-Ying, 26

Hsu, Wei-Yao, 15, 1J, 26

Hu, Qing, 09

Huang, Chien-Yao, 15, 26

Huang, Hongxin, 2A

Huang, Jinxin, 0P

Huang, Wei, 1Q, 1R

Hutiu, Gh., 0Q

Huttenhuis, Stephan, 1E

Hyun, Sang-Won, 25, 2H

Ignatovich, Filipp V., 1W, 1X

Inoue, Takashi, 2A

Ivanov, Trevor, 0P

Izazaga-Pérez, R., 1P, 1Z, 24

Jacobs, Ben, 1C

Jacobs, S. D., 07

Jeon, Min-Woo, 25

Jiang, Jiabin, 29, 2G

Johnson, Peter, 2K

Kenagy, Kurtis L., 0Y

Kennon, Jim, 0V

Kestner, Bob, 0V

Kim, ByoungChang, 2H

Kim, Dae Wook, 0Y

Kim, Geon-Hee, 25, 2H

Kinast, Jan, 11, 13

Kudo, Ryota, 1B

Kumler, Jay, 0T

Kuo, Ching-Hsiang, 15, 26

Küpper, Lutz, 0X

Lambropoulos, J. C., 07

Langehanenberg, Patrik, 14

Lavergne, O., 1U

Lee, SeoungWon, 2H

Leitz, Ernst Michael, 0I, 0K

Lequime, Michel, 21

Li, Bing, 2N

Li, Yaguo, 27

Liebl, Johannes, 0X

Light, Brandon, 0R

Ling, Tong, 29, 2G

Lintz, E. A., 0Z

Liu, Defu, 09

Liu, Dong, 1Q, 1R, 29, 2D, 2G

Liu, Shijie, 2O, 2P

Loeff, Adrian R., 0Y

López-Cortés, V., 24

López-Hernández, N., 24

Lüerß, Bernd, 14

Lumeau, Julien, 21

Luo, Jia, 2A

Lynch, Timothy P., 1F

Madsen, Morten H., 0B

Maloney, Chris, 0G

Marchetti, Lou, 0V

Marcus, Michael A., 1W, 1X

Martin, Hubert M., 0Y

Mathieu, Karine, 21

Matsui, Yoshinori, 2A

Matthews, Greg, 0H, 1M

Maunier, C., 08

Mckenna, P., 1V

Medicus, Kate, 0D, 18, 1F

Miao, Liang, 1Q, 1R

Mimura, Hidekazu, 2C

Mkoko, Zwelinzima, 1J

Mooney, J. T., 0Z

Moos, Steffen, 0K

Mouri, Naoki, 0N

Murphy, Paul E., 0F, 1N

Myer, Brian W., 1F

Nakano, Motohiro, 1B

Neauport, J., 08

Negrutiu, M. L., 0Q

Nelson, J., 1L, 1V

Nemechek, John J., 1S

Niehaus, Frank, 1E

Onyenemezu, Clement, 06

Oswald, Eric S., 0G

Peng, Wei-Jei, 15, 26

Penzkofer, Karlheinz, 0X

Percino-Zacarías, M. E., 1P, 24

Petersen, Jan C., 0B

Petter, J., 1O

Pilný, Lukáš, 0B

Podoleanu, A., 0Q

Qiao, Jie, 0M

Qiao, Jun, 0M

Quechol-López, J. T., 24

Rascher, Rolf, 0X

Ricci, Michael A., 2E

Risse, Stefan, 11, 13

Roblee, Jeff, 1C

Rogers, John, 0S

Rolland, Jannick P., 0O, 0P, 0Q, 0U, 16, 17, 1A

Romanofsky, H. J., 07

Rosczyk, Benjamin, 06

Ross, James, 1D, 1G

Rullier, Jean-Luc, 0A

Saito, Takahiro, 2C

Saito, Yusuke, 0N

Salazar-Morales, M. T., 1P

Salzman, S., 07

Santhanam, Anand P., 0O

Sarkas, Harry W., 05, 0C

Savin De Larclause, Isabelle, 21

Schiesser, Eric, 17

Schmelzer, Olaf, 0E

Schwalb, Fabian, 0I

Schwertz, K., 1L, 1V

Scordato, M., 1L, 1V

Shao, Jianda, 2O, 2P

Shen, Yibing, 1Q, 1R, 2D

Shi, Tu, 1Q, 1R, 2D

Sinescu, C., 0Q

Sisk, Raymond W., 0Y

Stephenson, Dave, 0T

Stover, E., 1O

Stroh, Carsten, 0I

Sun, Bin, 2N

Taboryski, Rafael, 0B

Takeo, Yoko, 2C

Takino, Hideo, 0N

Tankam, Patrice, 0O

Taroux, Daniel, 0A

Taylor, B., 07

Taylor, Lauren L., 0M

Thompson, Kevin P., 0U, 16, 17

Tierson, Jay, 0H

Titov, Artem, 06

Tokuta, Yusuke, 1B

Torres, Josh, 1G

Toyoda, Haruyoshi, 2A

Tsuji, Kazuya, 0N

Tünnermann, Andreas, 11, 13

Villalobos-Mendoza, B., 1P, 1Z, 24

Vishnia, Itai, 28

Wall, Christopher, 2K

Walter, Mark, 1C

Walters, Mark, 0D

Wang, Chen, 2E

Wattellier, B., 1T, 1U

Wei, Chaoyang, 2O, 2P

Wei, Qun, 2E

Weingarten, Christian, 03

Wendel, M., 1O

Wielandts, Marc, 1K

Wielandts, Remi, 1K

Wilde, Chrisitan, 14

Willenborg, Edgar, 03

Williams, Wesley B., 04

Wolfs, Franciscus, L., 0L, 1D, 1G

Wu, Lunzhe, 2P

Wu, Yingchao, 03

Xu, Di, 1A

Xu, Xueke, 2O, 2P

Yamamura, Kazuya, 1B

Yang, Minghong, 2O, 2P

Yang, Yongying, 1Q, 1R, 29, 2D, 2G

Yao, Jianing, 0P, 1A

Yonnet, M., 1U

Yu, Zong-Ru, 15, 26

Yuan, Joe, 18

Yue, Xiumei, 29, 2G

Zeitner, Uwe D., 13

Zhang, Lei, 1Q, 1R, 2D

Zhao, Nan, 1A

Zhao, Wei, 2K

Conference Committee

Symposium Chairs

  • Julie L. Bentley, University of Rochester (United States)

    Sebastian Stoebenau, OptoTech Optikmaschinen GmbH (Germany)

Conference Chairs

  • Julie L. Bentley, University of Rochester (United States)

    Sebastian Stoebenau, OptoTech Optikmaschinen GmbH (Germany)

Conference Program Committee

  • Thomas Battley, New York Photonics Industry Association (United States)

    Michael J. Bechtold, OptiPro Systems (United States)

    Christopher T. Cotton, ASE Sailing Inc. (United States)

    Walter C. Czajkowski, Edmund Optics, Inc. (United States)

    Thomas Danger, Schneider GmbH & Company KG (Germany)

    Michael A. DeMarco, QED Technologies, Inc. (United States)

    Apostolos Deslis, JENOPTIK Optical Systems, LLC (United States)

    Toshihide Dohi, OptiWorks, Inc. (Japan)

    Tom Godin, Satisloh North America Inc. (United States)

    Heidi Hofke, OptoTech Optical Machinery Inc. (United States)

    Jay Kumler, JENOPTIK Optical Systems, LLC (United States)

    Justin J. Mahanna, Universal Photonics Inc. (United States)

    Michael A. Marcus, Lumetrics, Inc. (United States)

    Paul Meier-Wang, AccuCoat Inc. (United States)

    Ted Mooney, Harris Geospatial Systems (United States)

    Rick A. Nasca, Corning Tropel Corporation (United States)

    Michael N. Naselaris, Sydor Optics, Inc. (United States)

    Richard Nastasi, Universal Photonics Inc. (United States)

    John J. Nemechek, Metrology Concepts LLC (United States)

    Buzz Nesti, Naked Optics Corporation (United States)

    Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)

    Paul Tolley, Smart System Technology & Commercialization Center (United States)

    Martin J. Valente, Arizona Optical Systems, LLC (United States)

    Kirk J. Warden, LaCroix Optical Company (United States)

    Robert Wiederhold, Optimax Systems, Inc. (United States)

Session Chairs

Plenary Session

Julie L. Bentley, University of Rochester (United States)

  • 1 Grinding and Polishing Processes I

    Jessica DeGroote Nelson, Optimax Systems, Inc. (United States)

  • 2 Grinding and Polishing Processes II

    Michael J. Bechtold, OptiPro Systems (United States)

  • 3 Grinding and Polishing Processes III

    Sebastian Stoebenau, OptoTech Optikmaschinen GmbH (Germany)

  • 4 Grinding and Polishing Processes IV and Metrology I

    Matthias Pfaff, OptoTech Optikmaschinen GmbH (Germany)

  • 5 Optical Design

    Richard N. Youngworth, Riyo LLC (United States)

  • 6 Fabrication and Testing of Mirrors

    Paul Dumas, QED Technologies, Inc. (United States)

  • 7 Optical Engineering

    Theodore Tienvieri, Corning Tropel Corporation (United States)

  • 8 Freeform I

    Dave Stephenson, JENOPTIK Optical Systems, Inc. (United States)

  • 9 Freeform II

    John Rogers, Synopsis, Inc. (United States)

  • 10 Diamond Turning and Molded Optics

    Jonathan D. Ellis, University of Rochester (United States)

  • 12 Metrology II

    Michael A. Marcus, Lumetrics, Inc. (United States)

  • 13 Metrology III

    Kate Medicus, Optimax Systems, Inc. (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9633", Proc. SPIE 9633, Optifab 2015, 963301 (23 October 2015); doi: 10.1117/12.2222197; https://doi.org/10.1117/12.2222197
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