11 October 2015 Model-based phase-shifting interferometer
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Proceedings Volume 9633, Optifab 2015; 96331R (2015) https://doi.org/10.1117/12.2195845
Event: SPIE Optifab, 2015, Rochester, New York, United States
A model-based phase-shifting interferometer (MPI) is developed, in which a novel calculation technique is proposed instead of the traditional complicated system structure, to achieve versatile, high precision and quantitative surface tests. In the MPI, the partial null lens (PNL) is employed to implement the non-null test. With some alternative PNLs, similar as the transmission spheres in ZYGO interferometers, the MPI provides a flexible test for general spherical and aspherical surfaces. Based on modern computer modeling technique, a reverse iterative optimizing construction (ROR) method is employed for the retrace error correction of non-null test, as well as figure error reconstruction. A self-compiled ray-tracing program is set up for the accurate system modeling and reverse ray tracing. The surface figure error then can be easily extracted from the wavefront data in forms of Zernike polynomials by the ROR method. Experiments of the spherical and aspherical tests are presented to validate the flexibility and accuracy. The test results are compared with those of Zygo interferometer (null tests), which demonstrates the high accuracy of the MPI. With such accuracy and flexibility, the MPI would possess large potential in modern optical shop testing.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dong Liu, Dong Liu, Lei Zhang, Lei Zhang, Tu Shi, Tu Shi, Yongying Yang, Yongying Yang, Shiyao Chong, Shiyao Chong, Liang Miao, Liang Miao, Wei Huang, Wei Huang, Yibing Shen, Yibing Shen, Jian Bai, Jian Bai, } "Model-based phase-shifting interferometer", Proc. SPIE 9633, Optifab 2015, 96331R (11 October 2015); doi: 10.1117/12.2195845; https://doi.org/10.1117/12.2195845

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