28 September 2015 Bragg grating fabrication on tapered fiber tips based on focused ion beam milling
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Proceedings Volume 9634, 24th International Conference on Optical Fibre Sensors; 96343I (2015) https://doi.org/10.1117/12.2194978
Event: International Conference on Optical Fibre Sensors (OFS24), 2015, Curitiba, Brazil
Abstract
Focused ion beam milling is used on chemically etched tapered fiber tips to create fiber Bragg gratings. These fiber Bragg gratings are based on a modulation of silica and external medium. This leads to a wide and structured spectrum obtained due to imperfections and the inherent structure of the tip. The fiber Bragg gratings presented are very short and have a length of 27 μm and 43 μm and are milled on the tapered fiber tip. They are characterized in the high temperature range 350-850ºC and a sensitivity of 14.4 pm/K is determined.
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Ricardo M. André, Ricardo M. André, Martin Becker, Martin Becker, Jan Dellith, Jan Dellith, Manfred Rothhardt, Manfred Rothhardt, M. I. Zibaii, M. I. Zibaii, H. Latifi, H. Latifi, Manuel B. Marques, Manuel B. Marques, Hartmut Bartelt, Hartmut Bartelt, Orlando Frazão, Orlando Frazão, } "Bragg grating fabrication on tapered fiber tips based on focused ion beam milling", Proc. SPIE 9634, 24th International Conference on Optical Fibre Sensors, 96343I (28 September 2015); doi: 10.1117/12.2194978; https://doi.org/10.1117/12.2194978
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