9 November 2015 Front Matter: Volume 9636
Proceedings Volume 9636, Scanning Microscopies 2015; 963601 (2015) https://doi.org/10.1117/12.2228190
Event: SPIE Scanning Microscopies, 2015, Monterey, California, United States
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9636, including the Title Page, Copyright information, Table of Contents, Introduction (if any), and Conference Committee listing.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Scanning Microscopies 2015, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, Tim K. Maugel, Proceedings of SPIE Vol. 9636 (SPIE, Bellingham, WA, 2015) Six-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781628418460

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a six-digit CID article numbering system structured as follows:

  • The first four digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Allen, Joyce, 0N

Antonov, A. S., 0R

Bergmann, D., 0S

Bodermann, B., 0S

Bosse, H., 0S

Bouchet-Marquis, Cedric, 06

Buhr, E., 0S

Cheng, Huikai, 06

Choi, Seong Soo, 0B

Clarke, Jamil J., 07

Dai, G., 0S

Dixson, Ronald, 0Q, 0S

Fraxedas, J., 0O

Goldband, Ryan S., 0Q

Gramazio, F., 0O

Gregory, Otto J., 0F

Gubskiy, K. L., 0R

Hahm, K., 0S

Han, Chul Hee, 0B

Häßler-Grohne, W., 0S

He, Jinping, 0A

Healy, Nancy, 0M, 0N

Henderson, Walter, 0M

Janssen, Martin, 0I

Kazieva, T. V., 0R

Kim, Sung In, 0B

Kim, Yong-Sang, 0B

Knijnenberg, Alwin, 0I

Kobayashi, Takayoshi, 0A

Kuznetsov, A. P., 0R

Lorenzoni, M., 0O

Menshew, D., 0L

Miyazaki, Jun, 0A

Newbury, Dale E., 0T

Niemeyer, Wayne D., 0G

Orji, Ndubuisi G., 0Q

Park, Kyung Jin, 0B

Park, Myoung Jin, 0B

Park, Nam Kyou, 0B

Pérez-Murano, F., 0O

Platek, Michael J., 0F

Ponarina, M. V., 0R

Postek, Michael T., 05

Reshetov, V. N., 0R

Ritchie, Nicholas W. M., 0T

Rull Trinidad, E., 0O

Stamouli, Amalia, 0I

Staufer, U., 0O

Tsurui, Hiromichi, 0A

Useinov, A. S., 0R

Van Leer, Brandon, 06

Vladár, András E., 05

Wang, Nan, 0A

Wurm, M., 0S

Yoo, Jung Ho, 0B

Conference Committee

Conference Chairs

  • Michael T. Postek, National Institute of Standards and Technology (United States)

  • Dale E. Newbury, National Institute of Standards and Technology (United States)

  • S. Frank Platek, United States Food and Drug Administration (United States)

  • Tim K. Maugel, University of Maryland, College Park (United States)

Conference Program Committee

  • Eva M. Campo, Bangor University (United Kingdom)

  • Petr Cizmar, Physikalisch-Technische Bundesanstalt (Germany)

  • Ronald G. Dixson, National Institute of Standards and Technology (United States)

  • Raynald Gauvin, McGill University (Canada)

  • Lynne M. Gignac, IBM Thomas J. Watson Research Center (United States)

  • Robert Gordon, Hitachi High Technologies America, Inc. (United States)

  • Michael J. McVicar, Center of Forensic Sciences (Canada)

  • John S. Villarrubia, National Institute of Standards and Technology (United States)

  • András E. Vladár, National Institute of Standards and Technology (United States)

  • Lucille A. Giannuzzi, L.A. Giannuzzi & Associates LLC (United States)

Session Chairs

  • Keynote Session

  • Naoya Hayashi, Dai Nippon Printing Company, Ltd. (Japan)

  • Bryan S. Kasprowicz, Photronics, Inc. (United States)

  • 1 Invited Session: Joint with Photomask and Scanning Microscopies

    Naoya Hayashi, Dai Nippon Printing Company, Ltd. (Japan)

    Bryan S. Kasprowicz, Photronics, Inc. (United States)

    Michael T. Postek, National Institute of Standards and Technology (United States)

  • 2 Advances in Optical and Particle Beam Microscopies I

    Dale E. Newbury, National Institute of Standards and Technology (United States)

    Lucille A. Giannuzzi, L.A. Giannuzzi & Associates LLC (United States)

  • 3 Advancements in Optical and Particle Beam Microscopies II

    Lucille A. Giannuzzi, L.A. Giannuzzi & Associates LLC (United States) (United States)

  • 4 Advancements in Optical and Particle Beam Microscopies III

    András E. Vladár, National Institute of Standards and Technology (United States)

    Lucille A. Giannuzzi, L.A. Giannuzzi & Associates LLC (United States)

  • 5 Scanning Beam Technologies and Applications: Joint Session with Photomask and Scanning Microscopies

    Michael T. Postek, National Institute of Standards and Technology (United States)

    Jan Hendrik Peters, Carl Zeiss SMS GmbH (Germany)

  • 6 Advancements in Microscopy for Forensic Science

    S. Frank Platek, United States Food and Drug Administration (United States)

    Michael J. McVicar, Center of Forensic Sciences (Canada)

  • 7 Microscopy for Science, Technology, Engineering, and Mathematics (STEM)

    Robert Gordon, Hitachi High Technologies America, Inc. (United States)

    Michael T. Postek, National Institute of Standards and Technology (United States)

  • 8 Advancements in Atomic Force Microscopy I

    Ronald G. Dixson, National Institute of Standards and Technology (United States)

    Lynne Gignac, IBM Thomas J. Watson Research Center (United States)

  • 9 Advancements in Atomic Force Microscopy II

    Lynne Gignac, IBM Thomas J. Watson Research Center (United States)

    Ronald G. Dixson, National Institute of Standards and Technology (United States)

  • 10 Advancements in X-Ray Microanalysis

    Dale E. Newbury, National Institute of Standards and Technology (United States)

    S. Frank Platek, United States Food and Drug Administration (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
} "Front Matter: Volume 9636", Proc. SPIE 9636, Scanning Microscopies 2015, 963601 (9 November 2015); doi: 10.1117/12.2228190; https://doi.org/10.1117/12.2228190
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