21 October 2015 Exploration of mXRF analysis of gunshot residue from cartridge cases
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Proceedings Volume 9636, Scanning Microscopies 2015; 96360I (2015) https://doi.org/10.1117/12.2197028
Event: SPIE Scanning Microscopies, 2015, Monterey, California, United States
Abstract
During the reconstruction of a shooting incident, several analytical techniques are at the disposal of forensic scientists. The Netherlands Forensic Institute is exploring the opportunities in which mXRF can be used to obtain information in these reconstructions. In this paper the possibilities of using the 2D-mXRF instrument as a screening tool are explored. Primarily the focus is on using mXRF to obtain information regarding the elemental composition of gunshot residue from cartridge cases. Secondly, the possibilities of using the 2D-mXRF instrument to, quickly and easily, set up databases for gunshot residue analysis are investigated.
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Martin Janssen, Martin Janssen, Amalia Stamouli, Amalia Stamouli, Alwin Knijnenberg, Alwin Knijnenberg, } "Exploration of mXRF analysis of gunshot residue from cartridge cases", Proc. SPIE 9636, Scanning Microscopies 2015, 96360I (21 October 2015); doi: 10.1117/12.2197028; https://doi.org/10.1117/12.2197028
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