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21 October 2015 Hitachi TM3030 engages at the nexus of cross-curriculum teaching and vertical articulation
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Proceedings Volume 9636, Scanning Microscopies 2015; 96360L (2015)
Event: SPIE Scanning Microscopies, 2015, Monterey, California, United States
When placed at a high school in one of the nation’s regions often cited in the press for negative metrics, the Hitachi TM3030 has proved to be a device that engenders a broad range of educational cooperative efforts. In this article, the author describes how the scanning electron microscope was used to connect learners from elementary school to university. Students from across the high school curriculum spectrum, including artists, poets, musicians and videographers used the device for advanced explorations. Unanticipated connections were made between at-risk and underserved groups with science learning using state of the art tabletop SEM technology. Teachers experienced new ways to motivate their students, and model curricula was developed that is now being used in educator training.
© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Menshew "Hitachi TM3030 engages at the nexus of cross-curriculum teaching and vertical articulation", Proc. SPIE 9636, Scanning Microscopies 2015, 96360L (21 October 2015);

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